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Resonance-enhanced waveguide-coupled silicon-germanium detector

Author(s)
Alloatti, Luca; Ram, Rajeev J
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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Abstract
A photodiode with 0.55 ± 0.1 A/W responsivity at a wavelength of 1176.9 nm has been fabricated in a 45 nm microelectronics silicon-on-insulator foundry process. The resonant waveguide photodetector exploits carrier generation in silicon-germanium within a microring which is compatible with high-performance electronics. A 3 dB bandwidth of 5 GHz at −4 V bias is obtained with a dark current of less than 20 pA.
Date issued
2016-02
URI
http://hdl.handle.net/1721.1/110934
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
Applied Physics Letters
Publisher
American Institute of Physics (AIP)
Citation
Alloatti, L. and Ram, R. J. “Resonance-Enhanced Waveguide-Coupled Silicon-Germanium Detector.” Applied Physics Letters 108, 7 (February 2016): 071105 © 2016 AIP Publishing LLC
Version: Final published version
ISSN
0003-6951
1077-3118

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