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dc.contributor.authorTran, Toan Trong
dc.contributor.authorElbadawi, Christopher
dc.contributor.authorTotonjian, Daniel
dc.contributor.authorLobo, Charlene J.
dc.contributor.authorGrosso, Gabriele
dc.contributor.authorMoon, Hyowon
dc.contributor.authorEnglund, Dirk R.
dc.contributor.authorFord, Michael J.
dc.contributor.authorAharonovich, Igor
dc.contributor.authorToth, Milos
dc.date.accessioned2017-08-24T18:43:18Z
dc.date.available2017-08-24T18:43:18Z
dc.date.issued2016-08
dc.date.submitted2016-06
dc.identifier.issn1936-0851
dc.identifier.issn1936-086X
dc.identifier.urihttp://hdl.handle.net/1721.1/111013
dc.description.abstractHexagonal boron nitride (hBN) is an emerging two-dimensional material for quantum photonics owing to its large bandgap and hyperbolic properties. Here we report two approaches for engineering quantum emitters in hBN multilayers using either electron beam irradiation or annealing and characterize their photophysical properties. The defects exhibit a broad range of multicolor room-temperature single photon emissions across the visible and the near-infrared spectral ranges, narrow line widths of sub-10 nm at room temperature, and a short excited-state lifetime, and high brightness. We show that the emitters can be categorized into two general groups, but most likely possess similar crystallographic structure. Remarkably, the emitters are extremely robust and withstand aggressive annealing treatments in oxidizing and reducing environments. Our results constitute a step toward deterministic engineering of single emitters in 2D materials and hold great promise for the use of defects in boron nitride as sources for quantum information processing and nanophotonics.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Award 1542863)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/acsnano.6b03602en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourcearXiven_US
dc.titleRobust Multicolor Single Photon Emission from Point Defects in Hexagonal Boron Nitrideen_US
dc.typeArticleen_US
dc.identifier.citationTran, Toan Trong et al. “Robust Multicolor Single Photon Emission from Point Defects in Hexagonal Boron Nitride.” ACS Nano 10, 8 (August 2016): 7331–7338 © 2016 American Chemical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorGrosso, Gabriele
dc.relation.journalACS Nanoen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsTran, Toan Trong; Elbadawi, Christopher; Totonjian, Daniel; Lobo, Charlene J.; Grosso, Gabriele; Moon, Hyowon; Englund, Dirk R.; Ford, Michael J.; Aharonovich, Igor; Toth, Milosen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2577-1755
mit.licensePUBLISHER_POLICYen_US


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