dc.contributor.author | Hou, Haowen | |
dc.contributor.author | Liu, Zhihong | |
dc.contributor.author | Teng, Jinghua | |
dc.contributor.author | Chua, Soo-Jin | |
dc.contributor.author | Palacios, Tomas | |
dc.date.accessioned | 2017-09-18T18:19:04Z | |
dc.date.available | 2017-09-18T18:19:04Z | |
dc.date.issued | 2016-11 | |
dc.date.submitted | 2016-08 | |
dc.identifier.issn | 1882-0778 | |
dc.identifier.issn | 1882-0786 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/111598 | |
dc.description.abstract | We report a sub-terahertz (THz) detector based on a 0.25-µm-gate-length AlGaN/GaN high-electron-mobility transistor (HEMT) on a Si substrate with nanoantennas. The fabricated device shows excellent performance with a maximum responsivity (R v) of 15 kV/W and a minimal noise equivalent power (NEP) of 0.58 pW/Hz[superscript 0.5] for 0.14 THz radiation at room temperature. We consider these excellent results as due to the design of asymmetric nanoantennas. From simulation, we show that indeed such nanoantennas can effectively enhance the local electric field induced by sub-THz radiation and thereby improve the detection response. The excellent results indicate that GaN HEMTs with nanoantennas are future competitive detectors for sub-THz and THz imaging applications. | en_US |
dc.description.sponsorship | United States. Army Research Office (Contract W911NF-14-2-0071) | en_US |
dc.language.iso | en_US | |
dc.publisher | Japan Society of Applied Physics | en_US |
dc.relation.isversionof | http://dx.doi.org/10.7567/APEX.10.014101 | en_US |
dc.rights | Creative Commons Attribution 4.0 International License | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en_US |
dc.source | IOP Publishing | en_US |
dc.title | A sub-terahertz broadband detector based on a GaN high-electron-mobility transistor with nanoantennas | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Hou, Haowen et al. “A Sub-Terahertz Broadband Detector Based on a GaN High-Electron-Mobility Transistor with Nanoantennas.” Applied Physics Express 10, 1 (November 2016): 014101 © 2017 The Japan Society of Applied Physics | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.mitauthor | Palacios, Tomas | |
dc.relation.journal | Applied Physics Express | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Hou, Haowen; Liu, Zhihong; Teng, Jinghua; Palacios, Tomás; Chua, Soo-Jin | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-2190-563X | |
mit.license | PUBLISHER_CC | en_US |