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dc.contributor.authorKubota, Y
dc.contributor.authorMurata, K
dc.contributor.authorMiyawaki, J
dc.contributor.authorOzawa, K
dc.contributor.authorShirasawa, T
dc.contributor.authorFeng, B
dc.contributor.authorYamamoto, Sh
dc.contributor.authorLiu, R-Y
dc.contributor.authorYamamoto, S
dc.contributor.authorMahatha, S K
dc.contributor.authorSheverdyaeva, P
dc.contributor.authorMoras, P
dc.contributor.authorSuga, S
dc.contributor.authorHarada, Y
dc.contributor.authorWang, K L
dc.contributor.authorMatsuda, I
dc.contributor.authorOnbasli, Mehmet Cengiz
dc.contributor.authorRoss, Caroline A
dc.date.accessioned2017-10-18T17:23:45Z
dc.date.available2017-10-18T17:23:45Z
dc.date.issued2016-12
dc.date.submitted2016-10
dc.identifier.issn0953-8984
dc.identifier.issn1361-648X
dc.identifier.urihttp://hdl.handle.net/1721.1/111946
dc.description.abstractAn interface electron state at the junction between a three-dimensional topological insulator film, Bi₂Se₃, and a ferrimagnetic insulator film, Y₃Fe₅O₁₂ (YIG), was investigated by measurements of angle-resolved photoelectron spectroscopy and x-ray absorption magnetic circular dichroism. The surface state of the Bi₂Se₃ film was directly observed and localized 3d spin states of the Fe ³⁺ in the YIG film were confirmed. The proximity effect is likely described in terms of the exchange interaction between the localized Fe 3d electrons in the YIG film and delocalized electrons of the surface and bulk states in the Bi₂Se₃ film.en_US
dc.publisherIOP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1361-648X/29/5/055002en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleInterface electronic structure at the topological insulator–ferrimagnetic insulator junctionen_US
dc.typeArticleen_US
dc.identifier.citationKubota, Y et al. “Interface Electronic Structure at the Topological Insulator–ferrimagnetic Insulator Junction.” Journal of Physics: Condensed Matter 29, 5 (December 2016): 055002 © 2016 IOP Publishing Ltden_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorOnbasli, Mehmet Cengiz
dc.contributor.mitauthorRoss, Caroline A
dc.relation.journalJournal of Physics: Condensed Matteren_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2017-10-16T23:06:51Z
dspace.orderedauthorsKubota, Y; Murata, K; Miyawaki, J; Ozawa, K; Onbasli, M C; Shirasawa, T; Feng, B; Yamamoto, Sh; Liu, R-Y; Yamamoto, S; Mahatha, S K; Sheverdyaeva, P; Moras, P; Ross, C A; Suga, S; Harada, Y; Wang, K L; Matsuda, Ien_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-2262-1249
mit.licenseOPEN_ACCESS_POLICYen_US


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