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dc.contributor.authorPalmer, A.
dc.contributor.authorSilevitch, D. M.
dc.contributor.authorFeng, Yejun
dc.contributor.authorWang, Yishu
dc.contributor.authorBanerjee, A.
dc.contributor.authorRen, Y.
dc.contributor.authorRosenbaum, T. F.
dc.contributor.authorJaramillo, Rafael
dc.date.accessioned2017-10-23T17:28:06Z
dc.date.available2017-10-23T17:28:06Z
dc.date.issued2015-09
dc.date.submitted2015-06
dc.identifier.issn0034-6748
dc.identifier.issn1089-7623
dc.identifier.urihttp://hdl.handle.net/1721.1/111958
dc.description.abstractWe discuss techniques for performing continuous measurements across a wide range of pressure-fielderature phase space, combining the milli-Kelvin temperatures of a helium dilution refrigerator with the giga-Pascal pressures of a diamond anvil cell and the Tesla magnetic fields of a superconducting magnet. With a view towards minimizing remnant magnetic fields and background magnetic susceptibility, we characterize high-strength superalloy materials for the pressure cell assembly, which allows high fidelity measurements of low-field phenomena such as superconductivity below 100 mK at pressures above 10 GPa. In situ tunability and measurement of the pressure permit experiments over a wide range of pressure, while at the same time making possible precise steps across abrupt phase transitions such as those from insulator to metal.en_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4929861en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceOther repositoryen_US
dc.titleSub-Kelvin magnetic and electrical measurements in a diamond anvil cell withen_US
dc.typeArticleen_US
dc.identifier.citationPalmer, A. et al. “Sub-Kelvin Magnetic and Electrical Measurements in a Diamond Anvil Cell Within Situtunability.” Review of Scientific Instruments 86, 9 (September 2015): 093901 © 2015 AIP Publishing LLCen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorJaramillo, Rafael
dc.relation.journalReview of Scientific Instrumentsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2017-10-12T12:26:50Z
dspace.orderedauthorsPalmer, A.; Silevitch, D. M.; Feng, Yejun; Wang, Yishu; Jaramillo, R.; Banerjee, A.; Ren, Y.; Rosenbaum, T. F.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-3116-6719
mit.licensePUBLISHER_POLICYen_US


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