dc.contributor.author | Ding, Jun | |
dc.contributor.author | Zhang, Li | |
dc.contributor.author | Ren, Han | |
dc.contributor.author | Zhou, Mi | |
dc.contributor.author | Lin, Yuankun | |
dc.contributor.author | Hu, Juejun | |
dc.contributor.author | Zhang, Hualiang | |
dc.date.accessioned | 2017-11-20T15:54:10Z | |
dc.date.available | 2017-11-20T15:54:10Z | |
dc.date.issued | 2016-02 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.issn | 1996-756X | |
dc.identifier.uri | http://hdl.handle.net/1721.1/112234 | |
dc.description.abstract | In this paper, we proposed highly efficient all-dielectric Huygens' metasurfaces working at mid-IR frequencies. The meta-Atom of the designed Huygens' metasurface is a cubic dielectric resonator or its variety, which is made from PbTe that possesses a high refractive index of around 5 at mid-IR frequencies. By overlapping spectrally both the magnetic and electric dipole modes of the high-index dielectric resonators, a full phase coverage of 2π and an equal-magnitude transmission could be achieved, which are essential conditions for realizing a metasurface. Two Huygens' metasurfaces for beam bending are designed with a phase change between two consecutive meta-Atoms of π/4 and π/3, respectively. The simulation results agree well with the design theory. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Grant CMMI-1266251) | en_US |
dc.publisher | SPIE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1117/12.2212883 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | SPIE | en_US |
dc.title | Mid-IR high-index dielectric Huygens metasurfaces | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Ding, Jun, et al. Mid-IR High-Index Dielectric Huygens Metasurfaces. Edited by Bernd Witzigmann et al. Proceedings of SPIE, 9742, Physics and Simulation of Optoelectronic Devices XXIV; 974211 (2016) © 2016 SPIE | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.mitauthor | Zhang, Li | |
dc.contributor.mitauthor | Hu, Juejun | |
dc.relation.journal | Proceedings of SPIE--the Society of Photo-Optical Instrumentation Engineers | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dc.date.updated | 2017-10-11T17:06:23Z | |
dspace.orderedauthors | Ding, Jun; Zhang, Li; Ren, Han; Zhou, Mi; Lin, Yuankun; Hu, Juejun; Zhang, Hualiang | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-7233-3918 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |