Show simple item record

dc.contributor.authorLi, Chengtao
dc.contributor.authorJegelka, Stefanie Sabrina
dc.contributor.authorSra, Suvrit
dc.date.accessioned2018-02-05T15:49:36Z
dc.date.available2018-02-05T15:49:36Z
dc.date.issued2016-06
dc.identifier.urihttp://hdl.handle.net/1721.1/113415
dc.description.abstractThe Nyström method has long been popular for scaling up kernel methods. Its theoretical guarantees and empirical performance rely critically on the quality of the landmarks selected. We study landmark selection for Nyström using Determinantal Point Processes (Dpps), discrete probability models that allow tractable generation of diverse samples. We prove that landmarks selected via Dpps guarantee bounds on approximation errors; subsequently, we analyze implications for kernel ridge regression. Contrary to prior reservations due to cubic complexity of Dpp sampling, we show that (under certain conditions) Markov chain Dpp sampling requires only linear time in the size of the data. We present several empirical results that support our theoretical analysis, and demonstrate the superior performance of Dpp-based landmark selection compared with existing approachesen_US
dc.description.sponsorshipNational Science Foundation (U.S.) (CAREER Award 1553284)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant IIS-1409802)en_US
dc.description.sponsorshipGoogle (Firm) (Research Award)en_US
dc.language.isoen_US
dc.publisherProceedings of Machine Learning Researchen_US
dc.relation.isversionofhttp://proceedings.mlr.press/v48/en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleFast DPP Sampling for Nyström with Application to Kernel Methodsen_US
dc.typeArticleen_US
dc.identifier.citationLi, Chengtao, Stefanie Jegelka, and Suvrit Sra. "Fast Dpp Sampling for Nyström with Application to Kernel Methods." International Conference on Machine Learning, 20-22 June, 2016, New York, New York, Proceedings of Machine Learning Research, 2016.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorLi, Chengtao
dc.contributor.mitauthorJegelka, Stefanie Sabrina
dc.contributor.mitauthorSra, Suvrit
dc.relation.journalInternational Conference on Machine Learningen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsLi, Chengtao; Jegelka, Stefanie; Sra,Suvriten_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1532-3083
dc.identifier.orcidhttps://orcid.org/0000-0002-6121-9474
dc.identifier.orcidhttps://orcid.org/0000-0001-8516-4925
mit.licenseOPEN_ACCESS_POLICYen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record