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dc.contributor.authorLong, Fan
dc.contributor.authorRinard, Martin C
dc.date.accessioned2018-02-14T16:17:40Z
dc.date.available2018-02-14T16:17:40Z
dc.date.issued2016-05
dc.identifier.issn978-1-4503-3900-1
dc.identifier.urihttp://hdl.handle.net/1721.1/113656
dc.description.abstractWe present the first systematic analysis of key characteristics of patch search spaces for automatic patch generation systems. We analyze sixteen different configurations of the patch search spaces of SPR and Prophet, two current state-of-the-art patch generation systems. The analysis shows that 1) correct patches are sparse in the search spaces (typically at most one correct patch per search space per defect), 2) incorrect patches that nevertheless pass all of the test cases in the validation test suite are typically orders of magnitude more abundant, and 3) leveraging information other than the test suite is therefore critical for enabling the system to successfully isolate correct patches. We also characterize a key tradeoff in the structure of the search spaces. Larger and richer search spaces that contain correct patches for more defects can actually cause systems to find fewer, not more, correct patches. We identify two reasons for this phenomenon: 1) increased validation times because of the presence of more candidate patches and 2) more incorrect patches that pass the test suite and block the discovery of correct patches. These fundamental properties, which are all characterized for the first time in this paper, help explain why past systems often fail to generate correct patches and help identify challenges, opportunities, and productive future directions for the field.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (Grant FA8650-11-C-7192)en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (Grant FA8750-14-2-0242)en_US
dc.language.isoen_US
dc.publisherAssociation for Computing Machineryen_US
dc.relation.isversionofhttp://dx.doi.org/10.1145/2884781.2884872en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleAn analysis of the search spaces for generate and validate patch generation systemsen_US
dc.typeArticleen_US
dc.identifier.citationLong, Fan, and Martin Rinard. "An Analysis of the Search Spaces for Generate and Validate Patch Generation Systems." Proceedings of the 38th International Conference on Software Engineering - ICSE '16, 14-22 May, 2016, Austin, Texas, ACM Press, 2016, pp. 702–13.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorLong, Fan
dc.contributor.mitauthorRinard, Martin C
dc.relation.journalProceedings of the 38th International Conference on Software Engineering - ICSE '16en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsLong, Fan; Rinard, Martinen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-6232-3118
dc.identifier.orcidhttps://orcid.org/0000-0001-8095-8523
mit.licenseOPEN_ACCESS_POLICYen_US


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