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dc.contributor.authorSchottenhamml, Julia
dc.contributor.authorMaier, Andreas
dc.contributor.authorPugh, Edward N.
dc.contributor.authorLu, Chen David
dc.contributor.authorLee, ByungKun
dc.contributor.authorFujimoto, James G
dc.date.accessioned2018-03-21T17:44:45Z
dc.date.available2018-03-21T17:44:45Z
dc.date.issued2017-09
dc.date.submitted2017-05
dc.identifier.issn1552-5783
dc.identifier.urihttp://hdl.handle.net/1721.1/114249
dc.description.abstractPURPOSE. To examine outer retinal band changes after flash stimulus and subsequent dark adaptation with ultrahigh-resolution optical coherence tomography (UHR-OCT). METHODS. Five dark-adapted left eyes of five normal subjects were imaged with 3-μm axialresolution UHR-OCT during 30 minutes of dark adaptation following 96%, 54%, 23%, and 0% full-field and 54% half-field rhodopsin bleach. We identified the ellipsoid zone inner segment/outer segment (EZ[IS/OS]), cone interdigitation zone (CIZ), rod interdigitation zone (RIZ), retinal pigment epithelium (RPE), and Bruch’s membrane (BM) axial positions and generated two-dimensional thickness maps of the EZ(IS/OS) to the four bands. The average thickness over an area of the thickness map was compared against that of the dark-adapted baselines. The time-dependent thickness changes (photoresponses) were statistically compared against 0% bleach. Dark adaptometry was performed with the same bleaching protocol. RESULTS. The EZ(IS/OS)-CIZ photoresponse was significantly different at 96% (P < 0.0001) and 54% (P = 0.006) bleach. At all three bleaching levels, the EZ(IS/OS)-RIZ, -RPE, and -BM responses were significantly different (P < 0.0001). The EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ time courses were similar to the recovery of rod- and cone-mediated sensitivity, respectively, measured with dark adaptometry. The maximal EZ(IS/OS)-CIZ and EZ(IS/OS)-RIZ response magnitudes doubled from 54% to 96% bleach. Both EZ(IS/OS)-RPE and EZ(IS/OS)-BM responses resembled dampened oscillations that were graded in amplitude and duration with bleaching intensity. Half-field photoresponses were localized to the stimulated retina. CONCLUSIONS. With noninvasive, near-infrared UHR-OCT, we characterized three distinct, spatially localized photoresponses in the outer retinal bands. These photoresponses have potential value as physical correlates of photoreceptor function.en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (Grant 5-R01-EY011289-30)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (Grant UL1TR001064)en_US
dc.description.sponsorshipUnited States. Air Force. Office of Scientific Research (Grant FA99550-12-1-0499)en_US
dc.description.sponsorshipUnited States. Air Force. Office of Scientific Research (Grant FA9550-15-1-0473)en_US
dc.publisherAssociation for Research in Vision and Ophthalmology (ARVO)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1167/IOVS.17-22171en_US
dc.rightsCreative Commons Attribution 4.0 International Licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAssociation for Research in Vision and Ophthalmologyen_US
dc.titlePhotoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomographyen_US
dc.typeArticleen_US
dc.identifier.citationLu, Chen D. et al. “Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography.” Investigative Opthalmology & Visual Science 58, 11 (September 2017): 4632 © 2017 The Authorsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorLu, Chen David
dc.contributor.mitauthorLee, ByungKun
dc.contributor.mitauthorFujimoto, James G
dc.relation.journalInvestigative Opthalmology & Visual Scienceen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-02-23T14:44:46Z
dspace.orderedauthorsLu, Chen D.; Lee, ByungKun; Schottenhamml, Julia; Maier, Andreas; Pugh, Edward N.; Fujimoto, James G.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-6235-0143
dc.identifier.orcidhttps://orcid.org/0000-0001-5262-2264
dc.identifier.orcidhttps://orcid.org/0000-0002-0828-4357
mit.licensePUBLISHER_CCen_US


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