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dc.contributor.authorBidkhori, Hoda
dc.contributor.authorSimchi-Levi, David
dc.contributor.authorWei, Yehua
dc.date.accessioned2018-04-23T17:42:18Z
dc.date.available2018-04-23T17:42:18Z
dc.date.issued2016-02
dc.date.submitted2016-02
dc.identifier.issn0167-6377
dc.identifier.urihttp://hdl.handle.net/1721.1/114882
dc.description.abstractWe develop a distribution-free model to evaluate the performance of process flexibility structures when only the mean and partial expectation of the demand are known. We characterize the worst-case demand distribution under general concave objective functions, and apply it to derive tight lower bounds for the performance of chaining structures under the balanced systems (systems with the same number of plants and products). We also derive a simple lower bound for chaining-like structures under unbalanced systems with different plant capacities. Keywords: Process flexibility; Distributionally-robust analysis; Chaining; Production system designen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/J.ORL.2016.02.008en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceSSRNen_US
dc.titleAnalyzing process flexibility: A distribution-free approach with partial expectationsen_US
dc.typeArticleen_US
dc.identifier.citationBidkhori, Hoda et al. “Analyzing Process Flexibility: A Distribution-Free Approach with Partial Expectations.” Operations Research Letters 44, 3 (May 2016): 291–296 © 2016 Elsevier B.V.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Civil and Environmental Engineeringen_US
dc.contributor.mitauthorSimchi-Levi, David
dc.relation.journalOperations Research Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-04-20T11:27:24Z
dspace.orderedauthorsBidkhori, Hoda; Simchi-Levi, David; Wei, Yehuaen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-4650-1519
mit.licensePUBLISHER_CCen_US


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