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dc.contributor.authorCao, Norman
dc.contributor.authorMier, Andres M.
dc.contributor.authorRice, John E.
dc.date.accessioned2018-04-27T17:37:26Z
dc.date.available2018-04-27T17:37:26Z
dc.date.issued2016-08
dc.identifier.issn1940-087X
dc.identifier.urihttp://hdl.handle.net/1721.1/114999
dc.description.abstractX-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperature, and velocity with good spatial and time resolution. However, benchmarking atomic code modeling of X-ray spectra obtained from well-diagnosed laboratory plasmas is important to justify use of such spectra to determine plasma parameters when other independent diagnostics are not available. This manuscript presents the operation of the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR), a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma. In addition, this manuscript covers a laser blow-off system that can introduce such ions to the plasma with precise timing to allow for perturbative studies of transport in the plasma. Keywords: Engineering, Issue 114, X-Ray Spectroscopy, Crystal Spectroscopy, Plasma Physics, Fusion, Tokamaks, Plasma Diagnosticsen_US
dc.description.sponsorshipUnited States. Department of Energy (Contract DE-FC02-99ER54512)en_US
dc.description.sponsorshipUnited States. Department of Energy (Contract DE-AC02-76CH03073)en_US
dc.publisherMyJoVE Corporationen_US
dc.relation.isversionofhttp://dx.doi.org/10.3791/54408en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceJournal of Visualized Experimentsen_US
dc.titleApplying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnosticen_US
dc.typeArticleen_US
dc.identifier.citationCao, Norman M., et al. “Applying X-Ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic.” Journal of Visualized Experiments 114 (August 2016) © 2016 Journal of Visualized Experimentsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Centeren_US
dc.contributor.mitauthorCao, Norman
dc.contributor.mitauthorMier, Andres M.
dc.contributor.mitauthorRice, John E
dc.relation.journalJournal of Visualized Experimentsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-02-23T17:15:25Z
dspace.orderedauthorsCao, N. M.; Mier Valdivia, A. M.; Rice, J. E.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-9745-0275
dc.identifier.orcidhttps://orcid.org/0000-0001-8319-5971
mit.licensePUBLISHER_POLICYen_US


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