| dc.contributor.author | Liu, Frank | |
| dc.contributor.author | Cross, Colin A | |
| dc.date.accessioned | 2018-05-17T18:27:02Z | |
| dc.date.available | 2018-05-17T18:27:02Z | |
| dc.date.issued | 2015-11 | |
| dc.date.submitted | 2015-07 | |
| dc.identifier.issn | 2331-7019 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/115435 | |
| dc.description.abstract | The magnetic switching behavior in continuous NiFe films patterned with IrMn gratings is investigated experimentally and with micromagnetic simulations. The samples made by a two-step deposition process consist of a 10-nm-thick NiFe layer on which is placed 10-nm-thick IrMn stripes with width from 100 to 500 nm and period from 240 nm to 1 μm. Exchange bias is introduced by field cooling in directions parallel or perpendicular to the IrMn stripes. The samples display a two-step hysteresis loop for higher stripe width and period, as the pinned and unpinned regions of the NiFe reverse independently but a one-step loop for lower stripe periods. The transition between these regimes is reproduced by micromagnetic modeling. | en_US |
| dc.publisher | American Physical Society (APS) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1103/PHYSREVAPPLIED.4.054005 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | APS | en_US |
| dc.title | Magnetization Reversal in Ferromagnetic Films Patterned with Antiferromagnetic Gratings of Various Sizes | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Liu, F. and C. A. Ross. “Magnetization Reversal in Ferromagnetic Films Patterned with Antiferromagnetic Gratings of Various Sizes.” Physical Review Applied 4, 5 (November 2015): 054005 © 2015 American Physical Society | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
| dc.contributor.mitauthor | Liu, Frank | |
| dc.contributor.mitauthor | Cross, Colin A | |
| dc.relation.journal | Physical Review Applied | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2018-05-08T15:14:11Z | |
| dspace.orderedauthors | Liu, F.; Ross, C. A. | en_US |
| dspace.embargo.terms | N | en_US |
| mit.license | PUBLISHER_POLICY | en_US |