TES-Based Light Detectors for the CRESST Direct Dark Matter Search
Author(s)
Rothe, J.; Angloher, G.; Bauer, P.; Bento, A.; Bucci, C.; D’Addabbo, A.; Defay, X.; Erb, A.; Feilitzsch, F. v; Ferreiro Iachellini, N.; Gorla, P.; Gütlein, A.; Hauff, D.; Jochum, J.; Kiefer, M.; Kluck, H.; Kraus, H.; Lanfranchi, J.-C.; Langenkämper, A.; Loebell, J.; Mancuso, M.; Mondragon, E.; Münster, A.; Pagliarone, C.; Petricca, F.; Potzel, W.; Pröbst, F.; Puig, R.; Reindl, F.; Schäffner, K.; Schieck, J.; Schipperges, V.; Schönert, S.; Seidel, W.; Stahlberg, M.; Stodolsky, L.; Strandhagen, C.; Strauss, R.; Tanzke, A.; Trinh Thi, H. H; Türkoğlu, C.; Ulrich, A.; Usherov, I.; Wawoczny, S.; Willers, M.; Wüstrich, M.; Canonica, Lucia; ... Show more Show less
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The CRESST experiment uses cryogenic detectors based on transition-edge sensors to search for dark matter interactions. Each detector module consists of a scintillating CaWO₄ crystal and a silicon-on-sapphire (SOS) light detector which operate in coincidence (phonon-light technique). The 40-mm-diameter SOS disks (2 g mass) used in the data taking campaign of CRESST-II Phase 2 (2014–2016) reached absolute baseline resolutions of σ = 4–7 eV. This is the best performance reported for cryogenic light detectors of this size. Newly developed silicon beaker light detectors (4 cm height, 4 cm diameter, 6 g mass), which cover a large fraction of the target crystal surface, have achieved a baseline resolution of σ = 5.8 eV. First results of further improved light detectors developed for the ongoing low-threshold CRESST-III experiment are presented. Keywords:
Transition-edge sensor; Cryogenic light detector; Direct dark matter search
Date issued
2018-05Department
Massachusetts Institute of Technology. Laboratory for Nuclear ScienceJournal
Journal of Low Temperature Physics
Publisher
Springer-Verlag
Citation
Rothe, J. et al. “TES-Based Light Detectors for the CRESST Direct Dark Matter Search.” Journal of Low Temperature Physics (May 2018): 1-7 © 2018 The Author(s)
Version: Final published version
ISSN
0022-2291
1573-7357