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dc.contributor.authorCao, Penghui
dc.contributor.authorShort, Michael P
dc.contributor.authorYip, Sidney
dc.date.accessioned2018-06-26T13:47:36Z
dc.date.available2018-06-26T13:47:36Z
dc.date.issued2017-12
dc.identifier.issn0027-8424
dc.identifier.issn1091-6490
dc.identifier.urihttp://hdl.handle.net/1721.1/116602
dc.description.abstractMolecular processes of creep in metallic glass thin films are simulated at experimental timescales using a metadynamics-based atomistic method. Space-time evolutions of the atomic strains and nonaffine atom displacements are analyzed to reveal details of the atomic-level deformation and flow processes of amorphous creep in response to stress and thermal activations. From the simulation results, resolved spatially on the nanoscale and temporally over time increments of fractions of a second, we derive a mechanistic explanation of the well-known variation of creep rate with stress. We also construct a deformation map delineating the predominant regimes of diffusional creep at low stress and high temperature and deformational creep at high stress. Our findings validate the relevance of two original models of the mechanisms of amorphous plasticity: one focusing on atomic diffusion via free volume and the other focusing on stress-induced shear deformation. These processes are found to be nonlinearly coupled through dynamically heterogeneous fluctuations that characterize the slow dynamics of systems out of equilibrium. Keywords: creep, molecular simulation, deformation mechanism, atomistic modeling, metallic glassen_US
dc.description.sponsorshipUnited States. Department of Energy (Grant DE-NE0008450)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (CAREER Grant DMR-1654548)en_US
dc.description.sponsorshipUnited States. Department of Energy. Office of Basic Energy Sciences (Grant DE-SC0002633)en_US
dc.publisherProceedings of the National Academy of Sciencesen_US
dc.relation.isversionofhttp://dx.doi.org/10.1073/PNAS.1708618114en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourcePNASen_US
dc.titleUnderstanding the mechanisms of amorphous creep through molecular simulationen_US
dc.typeArticleen_US
dc.identifier.citationCao, Penghui, et al. “Understanding the Mechanisms of Amorphous Creep through Molecular Simulation.” Proceedings of the National Academy of Sciences, vol. 114, no. 52, Dec. 2017, pp. 13631–36.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineeringen_US
dc.contributor.mitauthorCao, Penghui
dc.contributor.mitauthorShort, Michael P
dc.contributor.mitauthorYip, Sidney
dc.relation.journalProceedings of the National Academy of Sciencesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-06-21T15:45:53Z
dspace.orderedauthorsCao, Penghui; Short, Michael P.; Yip, Sidneyen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-9216-2482
dc.identifier.orcidhttps://orcid.org/0000-0002-2727-0137
mit.licensePUBLISHER_POLICYen_US


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