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dc.contributor.authorNavickas, Edvinas
dc.contributor.authorSasaki, Kazunari
dc.contributor.authorYildiz, Bilge
dc.contributor.authorHutter, Herbert
dc.contributor.authorFleig, Juergen
dc.contributor.authorHuber, Tobias
dc.contributor.authorTuller, Harry L
dc.date.accessioned2018-07-24T15:42:38Z
dc.date.available2018-07-24T15:42:38Z
dc.date.issued2018-06
dc.date.submitted2018-05
dc.identifier.issn0013-4651
dc.identifier.issn1945-7111
dc.identifier.urihttp://hdl.handle.net/1721.1/117076
dc.description.abstractMany efforts are being made to tune perovskite thin film cathodes toward improving their oxygen reduction kinetics and thereby improving overall solid oxide fuel cell performance. One approach is to enhance oxygen diffusion via introduction of larger concentrations of grain boundaries during thin film growth. While such grain boundary engineering has been shown to enhance ionic transport and surface reaction kinetics in some cases, little attention has been paid on its corresponding influence on electronic conductivity. To provide insights into the role of grain boundaries and their contribution to the cathode performance, we have investigated separately the electronic and ionic conductivity of La0.8Sr0.2MnO3(LSM) thin films by Van-der-Pauw and18O tracer exchange measurements respectively, as well as their combined contributions by electrochemical impedance spectroscopy. All three types of experiments were performed on the same kind of samples with varying LSM microstructure to illustrate the effects of grain boundaries on both electron and ion conduction. Correlations between active electrode area and microstructure-dependent partial conductivities are presented. The findings can also be used for optimizing current collector spacing in thin film solid oxide fuel cells. Keywords: grain boundary engineering; LSM; thin filmen_US
dc.description.sponsorshipUnited States. Department of Energy (Grant DE-SC0002633)en_US
dc.publisherElectrochemical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1149/2.1081809jesen_US
dc.rightsCreative Commons Attribution 4.0 International Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceECSen_US
dc.titleInterplay of Grain Size Dependent Electronic and Ionic Conductivity in Electrochemical Polarization Studies on Sr-Doped LaMnOen_US
dc.typeArticleen_US
dc.identifier.citationHuber, Tobias M. et al. “Interplay of Grain Size Dependent Electronic and Ionic Conductivity in Electrochemical Polarization Studies on Sr-Doped LaMnO₃(LSM) Thin Film Cathodes.” Journal of The Electrochemical Society 165, 9 (2018): F702–F709 © 2018 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorHuber, Tobias
dc.contributor.mitauthorTuller, Harry L
dc.relation.journalJournal of The Electrochemical Societyen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-07-23T12:58:32Z
dspace.orderedauthorsHuber, Tobias M.; Navickas, Edvinas; Sasaki, Kazunari; Yildiz, Bilge; Hutter, Herbert; Tuller, Harry; Fleig, Juergenen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-8339-3222
mit.licensePUBLISHER_CCen_US


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