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dc.contributor.authorYin, Han
dc.contributor.authorAkey, Austin J
dc.contributor.authorJaramillo, Rafael
dc.date.accessioned2018-08-13T15:42:52Z
dc.date.available2018-08-13T15:42:52Z
dc.date.issued2018-08
dc.date.submitted2017-04
dc.identifier.issn2475-9953
dc.identifier.urihttp://hdl.handle.net/1721.1/117334
dc.description.abstractLarge and persistent photoconductivity (LPPC) in semiconductors is due to the trapping of photogenerated minority carriers at crystal defects. Theory has suggested that anion vacancies in II-VI semiconductors are responsible for LPPC due to negative-U behavior, whereby two minority carriers become kinetically trapped by lattice relaxation following photoexcitation. By performing a detailed analysis of photoconductivity in CdS, we provide experimental support for this negative-U model of LPPC. We also show that LPPC is correlated with sulfur deficiency. We use this understanding to vary the photoconductivity of CdS films over nine orders of magnitude, and vary the LPPC characteristic decay time from seconds to 10⁴s by controlling the activities of Cd²⁺ and S²⁻ ions during chemical bath deposition. We suggest a screening method to identify other materials with long-lived, nonequilibrium, photoexcited states based on the results of ground-state calculations of atomic rearrangements following defect redox reactions, with a conceptual connection to polaron formation.en_US
dc.description.sponsorshipUnited States. Office of Naval Research (Grant N00014-17-1-2661)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevMaterials.2.084602en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleLarge and persistent photoconductivity due to hole-hole correlation in CdSen_US
dc.typeArticleen_US
dc.identifier.citationYin, Han et al. "Large and persistent photoconductivity due to hole-hole correlation in CdS." Physical Review Materials 2, 8 (August 2018): 084602 © 2018 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorYin, Han
dc.contributor.mitauthorJaramillo, Rafael
dc.relation.journalPhysical Review Materialsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-08-03T18:00:12Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsYin, Han; Akey, Austin; Jaramillo, R.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-6507-5140
dc.identifier.orcidhttps://orcid.org/0000-0003-3116-6719
mit.licensePUBLISHER_POLICYen_US


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