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dc.contributor.authorPeherstorfer, Benjamin
dc.contributor.authorCui, Tiangang
dc.contributor.authorMarzouk, Youssef M
dc.contributor.authorWillcox, Karen E
dc.date.accessioned2018-09-17T16:59:36Z
dc.date.available2018-09-17T16:59:36Z
dc.date.issued2016-03
dc.date.submitted2015-10
dc.identifier.issn00457825
dc.identifier.urihttp://hdl.handle.net/1721.1/118111
dc.description.abstractEstimating statistics of model outputs with the Monte Carlo method often requires a large number of model evaluations. This leads to long runtimes if the model is expensive to evaluate. Importance sampling is one approach that can lead to a reduction in the number of model evaluations. Importance sampling uses a biasing distribution to sample the model more efficiently, but generating such a biasing distribution can be difficult and usually also requires model evaluations. A different strategy to speed up Monte Carlo sampling is to replace the computationally expensive high-fidelity model with a computationally cheap surrogate model; however, because the surrogate model outputs are only approximations of the high-fidelity model outputs, the estimate obtained using a surrogate model is in general biased with respect to the estimate obtained using the high-fidelity model. We introduce a multifidelity importance sampling (MFIS) method, which combines evaluations of both the high-fidelity and a surrogate model. It uses a surrogate model to facilitate the construction of the biasing distribution, but relies on a small number of evaluations of the high-fidelity model to derive an unbiased estimate of the statistics of interest. We prove that the MFIS estimate is unbiased even in the absence of accuracy guarantees on the surrogate model itself. The MFIS method can be used with any type of surrogate model, such as projection-based reduced-order models and data-fit models. Furthermore, the MFIS method is applicable to black-box models, i.e., where only inputs and the corresponding outputs of the high-fidelity and the surrogate model are available but not the details of the models themselves. We demonstrate on nonlinear and time-dependent problems that our MFIS method achieves speedups of up to several orders of magnitude compared to Monte Carlo with importance sampling that uses the high-fidelity model only.en_US
dc.description.sponsorshipUnited States. Department of Energy. Office of Advanced Scientific Computing Research. Applied Mathematics Program (award DE-FG02-08ER2585)en_US
dc.description.sponsorshipUnited States. Department of Energy. Office of Advanced Scientific Computing Research. Applied Mathematics Program (award DE-SC0009297)en_US
dc.publisherElsevier BVen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/J.CMA.2015.12.002en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceOther repositoryen_US
dc.titleMultifidelity importance samplingen_US
dc.typeArticleen_US
dc.identifier.citationPeherstorfer, Benjamin, Tiangang Cui, Youssef Marzouk, and Karen Willcox. “Multifidelity Importance Sampling.” Computer Methods in Applied Mechanics and Engineering 300 (March 2016): 490–509.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorPeherstorfer, Benjamin
dc.contributor.mitauthorCui, Tiangang
dc.contributor.mitauthorMarzouk, Youssef M
dc.contributor.mitauthorWillcox, Karen E
dc.relation.journalComputer Methods in Applied Mechanics and Engineeringen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2018-09-13T12:58:31Z
dspace.orderedauthorsPeherstorfer, Benjamin; Cui, Tiangang; Marzouk, Youssef; Willcox, Karenen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5045-046X
dc.identifier.orcidhttps://orcid.org/0000-0002-4840-8545
dc.identifier.orcidhttps://orcid.org/0000-0001-8242-3290
dc.identifier.orcidhttps://orcid.org/0000-0003-2156-9338
mit.licensePUBLISHER_CCen_US


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