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Surface‐wave eikonal tomography in a scattering environment

Author(s)
Verdel, Arie; Gouedard, Pierre; Yao, Huajian; van der Hilst, Robert D
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Abstract
Surface waves are of increasing interest in seismic prospecting. Traveltime tomography based on dispersion measurements is often used to process surface-wave data, but it has limitations due to the a priori information it requires. The surface-wave eikonal tomography proposed here does not require such a priori information. In complex scattering environments, picking arrivals is difficult because the waveforms are complicated. Working in narrow frequency bands makes it even more difficult as it spreads arrivals in time and introduces overlap. We present here a neighborhood-based cross-correlation picking method that overcomes this difficulty, which then allows for reliable calculation of 2D phase-velocity variation through the eikonal equation.
Date issued
2010-01
URI
http://hdl.handle.net/1721.1/118420
Department
Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences
Journal
SEG Technical Program Expanded Abstracts 2010
Publisher
Society of Exploration Geophysicists
Citation
Gouédard, Pierre, Huajian Yao, Robert D. van der Hilst, and Arie Verdel. “Surface‐wave Eikonal Tomography in a Scattering Environment.” SEG Technical Program Expanded Abstracts 2010 (January 2010).
Version: Author's final manuscript

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