| dc.contributor.author | Cheng, Yu-Hsiang | |
| dc.contributor.author | Teitelbaum, Samuel Welch | |
| dc.contributor.author | Gao, Frank Y. | |
| dc.contributor.author | Nelson, Keith Adam | |
| dc.date.accessioned | 2018-11-05T20:53:55Z | |
| dc.date.available | 2018-11-05T20:53:55Z | |
| dc.date.issued | 2018-10 | |
| dc.date.submitted | 2018-08 | |
| dc.identifier.issn | 2469-9950 | |
| dc.identifier.issn | 2469-9969 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/118901 | |
| dc.description.abstract | Polycrystalline tellurium becomes amorphous after irradiation with strong femtosecond pulses. The amorphization is sensitive to the initial temperature but not very sensitive to the temporal profile of the optical excitation. Above the amorphization threshold, single-shot transient reflectivity traces show clear coherent phonon oscillations within 1 ps. These results suggest that amorphization is due to thermal melting rather than nonthermal melting or switching for pump fluences up to the ablation threshold. | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (Grant 1665383) | en_US |
| dc.description.sponsorship | United States. Office of Naval Research (Grant N00014-12-1-0530) | en_US |
| dc.publisher | American Physical Society | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevB.98.134112 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | American Physical Society | en_US |
| dc.title | Femtosecond laser amorphization of tellurium | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Cheng, Yu-Hsiang et al. "Femtosecond laser amorphization of tellurium." Physical Review B 98, 13 (October 2018): 134112 © 2018 American Physical Society | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Cheng, Yu-Hsiang | |
| dc.contributor.mitauthor | Teitelbaum, Samuel Welch | |
| dc.contributor.mitauthor | Gao, Frank Y. | |
| dc.contributor.mitauthor | Nelson, Keith Adam | |
| dc.relation.journal | Physical Review B | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2018-10-24T18:00:19Z | |
| dc.language.rfc3066 | en | |
| dc.rights.holder | American Physical Society | |
| dspace.orderedauthors | Cheng, Yu-Hsiang; Teitelbaum, Samuel W.; Gao, Frank Y.; Nelson, Keith A. | en_US |
| dspace.embargo.terms | N | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0001-9202-3338 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-0812-9832 | |
| dc.identifier.orcid | https://orcid.org/0000-0001-7804-5418 | |
| mit.license | PUBLISHER_POLICY | en_US |
