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dc.contributor.authorLim, K.
dc.contributor.authorSchelhas, L. T.
dc.contributor.authorZakutayev, A.
dc.contributor.authorLany, S.
dc.contributor.authorGorman, B.
dc.contributor.authorSun, C. J.
dc.contributor.authorGinley, D.
dc.contributor.authorToney, M. F.
dc.contributor.authorSiah, Sin Cheng
dc.contributor.authorBrandt, Riley E
dc.contributor.authorBuonassisi, Anthony
dc.date.accessioned2018-11-06T20:55:26Z
dc.date.available2018-11-06T20:55:26Z
dc.date.issued2016-10
dc.date.submitted2016-07
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/118933
dc.description.abstractThere have been a number of studies on the fabrication of Sn-doped gallium oxide (Ga2O3:Sn) films with both conductive and transparent properties using a variety of deposition methods. However, often, synthesis results in films that are not transparent. In this paper, we examine the mechanisms underlying these results in Ga2O3:Sn thin films prepared at various growth temperatures, Sn concentrations, and oxygen partial pressures. With X-ray absorption spectroscopy, transmission electron microscopy and energy dispersive spectroscopy, we find that when films are grown under the oxygen deficient conditions there are Ga sub-oxide and SnOxphases in the Ga2O3:Sn thin film. These Ga sub-oxide phases are only found in non-transparent films, and so we infer that the Ga sub-oxide is responsible for the non-transparency. These observations suggest that to obtain transparent Ga2O3:Sn, films deposition or subsequent annealing must be carefully controlled in both temperature and oxygen partial pressure to avoid the formation of Ga sub-oxide phases.en_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4964638en_US
dc.rightsCreative Commons Attribution 4.0 International Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAIPen_US
dc.titleThe effect of sub-oxide phases on the transparency of tin-doped gallium oxideen_US
dc.typeArticleen_US
dc.identifier.citationLim, K. et al. “The Effect of Sub-Oxide Phases on the Transparency of Tin-Doped Gallium Oxide.” Applied Physics Letters 109, 14 (October 2016): 141909 © 2016 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorSiah, Sin Cheng
dc.contributor.mitauthorBrandt, Riley E
dc.contributor.mitauthorBuonassisi, Anthony
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-11-02T15:40:45Z
dspace.orderedauthorsLim, K.; Schelhas, L. T.; Siah, S. C.; Brandt, R. E.; Zakutayev, A.; Lany, S.; Gorman, B.; Sun, C. J.; Ginley, D.; Buonassisi, T.; Toney, M. F.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-2785-552X
dc.identifier.orcidhttps://orcid.org/0000-0001-8345-4937
mit.licensePUBLISHER_CCen_US


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