Dynamic speckle illumination wide-field reflection phase microscopy
Author(s)
Choi, Youngwoon; Hosseini, Poorya; Choi, Wonshik; Dasari, Ramachandra R.; So, Peter T. C.; Yaqoob, Zahid; ... Show more Show less
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We demonstrate a quantitative reflection-phase microscope based on time-varying speckle-field illumination. Due to the short spatial coherence length of the speckle field, the proposed imaging system features superior lateral resolution, 520 nm, as well as high-depth selectivity, 1.03 μm. Off-axis interferometric detection enables wide-field and single-shot imaging appropriate for high-speed measurements. In addition, the measured phase sensitivity of this method, which is the smallest measurable axial motion, is more than 40 times higher than that available using a transmission system. We demonstrate the utility of our method by successfully distinguishing the motion of the top surface from that of the bottom in red blood cells. The proposed method will be useful for studying membrane dynamics in complex eukaryotic cells.
Date issued
2014-10Department
Massachusetts Institute of Technology. Department of Biological Engineering; Massachusetts Institute of Technology. Department of Mechanical EngineeringJournal
Optics Letters
Publisher
Optical Society of America
Citation
Choi, Youngwoon et al. “Dynamic Speckle Illumination Wide-Field Reflection Phase Microscopy.” Optics Letters 39, 20 (October 2014): 6062 © 2014 Optical Society of America
Version: Author's final manuscript
ISSN
0146-9592
1539-4794