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dc.contributor.authorStrempfer, J.
dc.contributor.authorChoi, Y.
dc.contributor.authorYou, H.
dc.contributor.authorMitchell, J. F.
dc.contributor.authorZhu, Z. H.
dc.contributor.authorRao, R. R.
dc.contributor.authorOcchialini, Connor A.
dc.contributor.authorPelliciari, Jonathan
dc.contributor.authorKawaguchi, Tadashi
dc.contributor.authorShao-Horn, Yang
dc.contributor.authorComin, Riccardo
dc.date.accessioned2019-01-08T18:37:48Z
dc.date.available2019-01-08T18:37:48Z
dc.date.issued2019-01
dc.date.submitted2018-11
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/119878
dc.description.abstractWe studied the magnetic ordering of thin films and bulk crystals of rutile RuO₂ using resonant x-ray scattering across the Ru L₂ absorption edge. Combining polarization analysis and azimuthal angle dependence of the magnetic Bragg signal, we have established the presence and characteristic of collinear antiferromagnetism in RuO₂ with T_{N}>300  K. In addition to revealing a spin-ordered ground state in the simplest ruthenium oxide compound, the persistence of magnetic order even in nanometer-thick films lays the ground for potential applications of RuO₂ in antiferromagnetic spintronics.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Through Massachusetts Institute of Technology Materials Research Science and Engineering Center, DMR-1419807)en_US
dc.description.sponsorshipAlfred P. Sloan Foundationen_US
dc.description.sponsorshipSwiss National Science Foundation (Early Postdoc.Mobility Fellowship Project No. P2FRP2_171824)en_US
dc.description.sponsorshipUnited States. Department of Energy. Office of Science. Basic Energy Sciences (Contract No. DE-AC02-06CH11357)en_US
dc.description.sponsorshipUnited States. Department of Energy. Division of Materials Sciences and Engineeringen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.122.017202en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleAnomalous Antiferromagnetism in Metallic RuO₂ Determined by Resonant X-ray Scatteringen_US
dc.typeArticleen_US
dc.identifier.citationZhu, Z. H., J. Strempfer, R. R. Rao, C. A. Occhialini, J. Pelliciari, Y. Choi, T. Kawaguchi, H. You, J. F. Mitchell, Y. Shao-Horn, and R. Comin. "Anomalous Antiferromagnetism in Metallic RuO₂ Determined by Resonant X-ray Scattering." Physical Review Letters 122, 017202 (2019).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorZhu, Z. H.
dc.contributor.mitauthorRao, R. R.
dc.contributor.mitauthorOcchialini, Connor A.
dc.contributor.mitauthorPelliciari, Jonathan
dc.contributor.mitauthorKawaguchi, Tadashi
dc.contributor.mitauthorShao-Horn, Yang
dc.contributor.mitauthorComin, Riccardo
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-01-03T18:00:13Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsZhu, Z. H.; Strempfer, J.; Rao, R. R.; Occhialini, C. A.; Pelliciari, J.; Choi, Y.; Kawaguchi, T.; You, H.; Mitchell, J. F.; Shao-Horn, Y.; Comin, R.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-1069-9973
mit.licensePUBLISHER_POLICYen_US


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