dc.contributor.author | Strempfer, J. | |
dc.contributor.author | Choi, Y. | |
dc.contributor.author | You, H. | |
dc.contributor.author | Mitchell, J. F. | |
dc.contributor.author | Zhu, Z. H. | |
dc.contributor.author | Rao, R. R. | |
dc.contributor.author | Occhialini, Connor A. | |
dc.contributor.author | Pelliciari, Jonathan | |
dc.contributor.author | Kawaguchi, Tadashi | |
dc.contributor.author | Shao-Horn, Yang | |
dc.contributor.author | Comin, Riccardo | |
dc.date.accessioned | 2019-01-08T18:37:48Z | |
dc.date.available | 2019-01-08T18:37:48Z | |
dc.date.issued | 2019-01 | |
dc.date.submitted | 2018-11 | |
dc.identifier.issn | 0031-9007 | |
dc.identifier.issn | 1079-7114 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/119878 | |
dc.description.abstract | We studied the magnetic ordering of thin films and bulk crystals of rutile RuO₂ using resonant x-ray scattering across the Ru L₂ absorption edge. Combining polarization analysis and azimuthal angle dependence of the magnetic Bragg signal, we have established the presence and characteristic of collinear antiferromagnetism in RuO₂ with T_{N}>300 K. In addition to revealing a spin-ordered ground state in the simplest ruthenium oxide compound, the persistence of magnetic order even in nanometer-thick films lays the ground for potential applications of RuO₂ in antiferromagnetic spintronics. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Through Massachusetts Institute of Technology Materials Research Science and Engineering Center, DMR-1419807) | en_US |
dc.description.sponsorship | Alfred P. Sloan Foundation | en_US |
dc.description.sponsorship | Swiss National Science Foundation (Early Postdoc.Mobility Fellowship Project No. P2FRP2_171824) | en_US |
dc.description.sponsorship | United States. Department of Energy. Office of Science. Basic Energy Sciences (Contract No. DE-AC02-06CH11357) | en_US |
dc.description.sponsorship | United States. Department of Energy. Division of Materials Sciences and Engineering | en_US |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevLett.122.017202 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | American Physical Society | en_US |
dc.title | Anomalous Antiferromagnetism in Metallic RuO₂ Determined by Resonant X-ray Scattering | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Zhu, Z. H., J. Strempfer, R. R. Rao, C. A. Occhialini, J. Pelliciari, Y. Choi, T. Kawaguchi, H. You, J. F. Mitchell, Y. Shao-Horn, and R. Comin. "Anomalous Antiferromagnetism in Metallic RuO₂ Determined by Resonant X-ray Scattering." Physical Review Letters 122, 017202 (2019). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
dc.contributor.mitauthor | Zhu, Z. H. | |
dc.contributor.mitauthor | Rao, R. R. | |
dc.contributor.mitauthor | Occhialini, Connor A. | |
dc.contributor.mitauthor | Pelliciari, Jonathan | |
dc.contributor.mitauthor | Kawaguchi, Tadashi | |
dc.contributor.mitauthor | Shao-Horn, Yang | |
dc.contributor.mitauthor | Comin, Riccardo | |
dc.relation.journal | Physical Review Letters | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2019-01-03T18:00:13Z | |
dc.language.rfc3066 | en | |
dc.rights.holder | American Physical Society | |
dspace.orderedauthors | Zhu, Z. H.; Strempfer, J.; Rao, R. R.; Occhialini, C. A.; Pelliciari, J.; Choi, Y.; Kawaguchi, T.; You, H.; Mitchell, J. F.; Shao-Horn, Y.; Comin, R. | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-1069-9973 | |
mit.license | PUBLISHER_POLICY | en_US |