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dc.contributor.authorYang, Shengyou
dc.contributor.authorZhao, Xuanhe
dc.contributor.authorSharma, Pradeep
dc.date.accessioned2019-02-11T15:18:16Z
dc.date.available2019-02-11T15:18:16Z
dc.date.issued2017-01
dc.date.submitted2016-12
dc.identifier.issn0021-8936
dc.identifier.urihttp://hdl.handle.net/1721.1/120313
dc.description.abstractDevelopment of soft electromechanical materials is critical for several tantalizing applications such as human-like robots, stretchable electronics, actuators, energy harvesting, among others. Soft dielectrics can be easily deformed by an electric field through the so-called electrostatic Maxwell stress. The highly nonlinear coupling between the mechanical and electrical effects in soft dielectrics gives rise to a rich variety of instability and bifurcation behavior. Depending upon the context, instabilities can either be detrimental, or more intriguingly, exploited for enhanced multifunctional behavior. In this work, we revisit the instability and bifurcation behavior of a finite block made of a soft dielectric material that is simultaneously subjected to both mechanical and electrical stimuli. An excellent literature already exists that has addressed the same topic. However, barring a few exceptions, most works have focused on the consideration of homogeneous deformation and accordingly, relatively fewer insights are at hand regarding the compressive stress state. In our work, we allow for fairly general and inhomogeneous deformation modes and, in the case of a neo-Hookean material, present closed-form solutions to the instability and bifurcation behavior of soft dielectrics. Our results, in the asymptotic limit of large aspect ratio, agree well with Euler's prediction for the buckling of a slender block and, furthermore, in the limit of zero aspect ratio are the same as Biot's critical strain of surface instability of a compressed homogeneous half-space of a neo-Hookean material. A key physical insight that emerges from our analysis is that soft dielectrics can be used as actuators within an expanded range of electric field than hitherto believed.en_US
dc.description.sponsorshipM.D. Anderson Foundation (Houston, Tex.)en_US
dc.description.sponsorshipNational Science Foundation (U.S.). Division of Civil, Mechanical and Manufacturing Innovation (Grant No. 1463339)en_US
dc.description.sponsorshipQatar National Research Fund. National Priorities Research Program (award NPRP 6-282-2-119)en_US
dc.publisherASME Internationalen_US
dc.relation.isversionofhttp://dx.doi.org/10.1115/1.4035499en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceASMEen_US
dc.titleRevisiting the Instability and Bifurcation Behavior of Soft Dielectricsen_US
dc.typeArticleen_US
dc.identifier.citationYang, Shengyou, Xuanhe Zhao, and Pradeep Sharma. “Revisiting the Instability and Bifurcation Behavior of Soft Dielectrics.” Journal of Applied Mechanics 84, no. 3 (January 24, 2017): 031008.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Civil and Environmental Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorZhao, Xuanhe
dc.relation.journalJournal of Applied Mechanicsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-01-16T13:30:49Z
dspace.orderedauthorsYang, Shengyou; Zhao, Xuanhe; Sharma, Pradeepen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-5387-6186
mit.licensePUBLISHER_POLICYen_US


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