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dc.contributor.authorShim, Inwook
dc.contributor.authorKweon, In So
dc.contributor.authorOh, Taehyun
dc.date.accessioned2019-02-15T20:07:02Z
dc.date.available2019-02-15T20:07:02Z
dc.date.issued2018-12
dc.date.submitted2018-10
dc.identifier.issn1424-8220
dc.identifier.urihttp://hdl.handle.net/1721.1/120468
dc.description.abstractThis paper presents a depth upsampling method that produces a high-fidelity dense depth map using a high-resolution RGB image and LiDAR sensor data. Our proposed method explicitly handles depth outliers and computes a depth upsampling with confidence information. Our key idea is the self-learning framework, which automatically learns to estimate the reliability of the upsampled depth map without human-labeled annotation. Thereby, our proposed method can produce a clear and high-fidelity dense depth map that preserves the shape of object structures well, which can be favored by subsequent algorithms for follow-up tasks. We qualitatively and quantitatively evaluate our proposed method by comparing other competing methods on the well-known Middlebury 2014 and KITTIbenchmark datasets. We demonstrate that our method generates accurate depth maps with smaller errors favorable against other methods while preserving a larger number of valid points, as we also show that our approach can be seamlessly applied to improve the quality of depth maps from other depth generation algorithms such as stereo matching and further discuss potential applications and limitations. Compared to previous work, our proposed method has similar depth errors on average, while retaining at least 3% more valid depth points. Keywords: depth upsampling; depth filtering; LiDAR; self-learning; self-supervised learningen_US
dc.publisherMultidisciplinary Digital Publishing Instituteen_US
dc.relation.isversionofhttp://dx.doi.org/10.3390/s19010081en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceMultidisciplinary Digital Publishing Instituteen_US
dc.titleHigh-Fidelity Depth Upsampling Using the Self-Learning Frameworken_US
dc.typeArticleen_US
dc.identifier.citationShim, Inwook et al. "High-Fidelity Depth Upsampling Using the Self-Learning Framework." Sensors 19, 1 (December 2018): 81 © The Authorsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.mitauthorOh, Taehyun
dc.relation.journalSensorsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-01-24T09:22:08Z
dspace.orderedauthorsShim, Inwook; Oh, Tae-Hyun; Kweon, Inen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-0468-1571
mit.licensePUBLISHER_CCen_US


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