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dc.contributor.authorConrad, Janet Marie
dc.contributor.authorSpitz, Joshua B.
dc.contributor.authorTerao, Kazuhiro
dc.date.accessioned2019-03-14T17:40:45Z
dc.date.available2019-03-14T17:40:45Z
dc.date.issued2016-08
dc.date.submitted2016-04
dc.identifier.issn1748-0221
dc.identifier.urihttp://hdl.handle.net/1721.1/120960
dc.description.abstractDuring the commissioning of the first of the two detectors of the Double Chooz experiment, an unexpected and dominant background caused by the emission of light inside the optical volume has been observed. A specific study of the ensemble of phenomena called Light Noise has been carried out in-situ, and in an external laboratory, in order to characterize the signals and to identify the possible processes underlying the effect. Some mechanisms of instrumental noise originating from the PMTs were identified and it has been found that the leading one arises from the light emission localized on the photomultiplier base and produced by the combined effect of heat and high voltage across the transparent epoxy resin covering the electric components. The correlation of the rate and the amplitude of the signal with the temperature has been observed. For the first detector in operation the induced background has been mitigated using online and offline analysis selections based on timing and light pattern of the signals, while a modification of the photomultiplier assembly has been implemented for the second detector in order to blacken the PMT bases.en_US
dc.publisherIOP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1748-0221/11/08/P08001en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleCharacterization of the spontaneous light emission of the PMTs used in the Double Chooz experimenten_US
dc.typeArticleen_US
dc.identifier.citationAbe, Y. et al. “Characterization of the Spontaneous Light Emission of the PMTs Used in the Double Chooz Experiment.” Journal of Instrumentation 11, 8 (August 2016): P08001–P08001 © 2016 IOP Publishing Ltd and Sissa Medialaben_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorConrad, Janet Marie
dc.contributor.mitauthorSpitz, Joshua B.
dc.contributor.mitauthorTerao, Kazuhiro
dc.relation.journalJournal of Instrumentationen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-03-14T14:11:08Z
dspace.orderedauthorsAbe, Y.; Abrahão, T.; Alt, C.; Appel, S.; Bekman, I.; Bergevin, M.; Bezerra, T.J.C.; Bezrukov, L.; Blucher, E.; Brugière, T.; Buck, C.; Busenitz, J.; Cabrera, A.; Calvo, E.; Camilleri, L.; Carr, R.; Cerrada, M.; Chauveau, E.; Chimenti, P.; Collin, A.P.; Conover, E.; Conrad, J.M.; Crespo-Anadón, J.I.; Crum, K.; Cucoanes, A.S.; Damon, E.; Dawson, J.V.; de Kerret, H.; Dhooghe, J.; Dietrich, D.; Djurcic, Z.; Anjos, J.C. dos; Dracos, M.; Etenko, A.; Fallot, M.; Felde, J.; Fernandes, S.M.; Fischer, V.; Franco, D.; Franke, M.; Furuta, H.; Gil-Botella, I.; Giot, L.; Göger-Neff, M.; Gomez, H.; Gonzalez, L.F.G.; Goodenough, L.; Goodman, M.C.; Haag, N.; Hara, T.; Haser, J.; Hellwig, D.; Hofmann, M.; Horton-Smith, G.A.; Hourlier, A.; Ishitsuka, M.; Jiménez, S.; Jochum, J.; Jollet, C.; Kaether, F.; Kalousis, L.N.; Kamyshkov, Y.; Kaneda, M.; Kaplan, D.M.; Kawasaki, T.; Kemp, E.; Kryn, D.; Kuze, M.; Lachenmaier, T.; Lane, C.E.; Lasserre, T.; Letourneau, A.; Lhuillier, D.; Jr., H.P. Lima; Lindner, M.; López-Castaño, J.M.; LoSecco, J.M.; Lubsandorzhiev, B.; Lucht, S.; Maeda, J.; Mariani, C.; Maricic, J.; Martino, J.; Matsubara, T.; Mention, G.; Meregaglia, A.; Miletic, T.; Minotti, A.; Nagasaka, Y.; Navas-Nicolás, D.; Novella, P.; Nunokawa, H.; Obolensky, M.; Onillon, A.; Osborn, A.; Palomares, C.; Pepe, I.M.; Perasso, S.; Porta, A.; Pronost, G.; Reichenbacher, J.; Reinhold, B.; Röhling, M.; Roncin, R.; Rybolt, B.; Sakamoto, Y.; Santorelli, R.; Schilithz, A.C.; Schönert, S.; Schoppmann, S.; Shaevitz, M.H.; Sharankova, R.; Shrestha, D.; Sibille, V.; Sinev, V.; Skorokhvatov, M.; Smith, E.; Soiron, M.; Spitz, J.; Stahl, A.; Stancu, I.; Stokes, L.F.F.; Strait, M.; Suekane, F.; Sukhotin, S.; Sumiyoshi, T.; Sun, Y.; Svoboda, R.; Terao, K.; Tonazzo, A.; Thi, H.H. Trinh; Valdiviesso, G.; Vassilopoulos, N.; Verdugo, A.; Veyssiere, C.; Vivier, M.; Feilitzsch, F. von; Wagner, S.; Walsh, N.; Watanabe, H.; Wiebusch, C.; Wurm, M.; Yang, G.; Yermia, F.; Zimmer, V.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-6393-0438
mit.licenseOPEN_ACCESS_POLICYen_US


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