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dc.contributor.authorMicroBooNE Collaboration
dc.contributor.authorAcciarri, R.
dc.contributor.authorAdams, C.
dc.contributor.authorAn, R.
dc.contributor.authorAnthony, J.
dc.contributor.authorAsaadi, J.
dc.contributor.authorAuger, M.
dc.contributor.authorBagby, L.
dc.contributor.authorBalasubramanian, S.
dc.contributor.authorBaller, B.
dc.contributor.authorBarnes, C.
dc.contributor.authorBarr, G.
dc.contributor.authorBass, M.
dc.contributor.authorBay, F.
dc.contributor.authorBishai, M.
dc.contributor.authorBlake, A.
dc.contributor.authorBolton, T.
dc.contributor.authorBullard, B.
dc.contributor.authorCamilleri, L.
dc.contributor.authorCaratelli, D.
dc.contributor.authorCarls, B.
dc.contributor.authorFernandez, R. Castillo
dc.contributor.authorCavanna, F.
dc.contributor.authorChen, H.
dc.contributor.authorChurch, E.
dc.contributor.authorCianci, D.
dc.contributor.authorCohen, E.
dc.contributor.authorConvery, M.
dc.contributor.authorCrespo-Anadón, J. I.
dc.contributor.authorGeronimo, G. De
dc.contributor.authorDel Tutto, M.
dc.contributor.authorDevitt, D.
dc.contributor.authorDytman, S.
dc.contributor.authorEberly, B.
dc.contributor.authorEreditato, A.
dc.contributor.authorEscudero Sanchez, L.
dc.contributor.authorEsquivel, J.
dc.contributor.authorFadeeva, A. A.
dc.contributor.authorFleming, B. T.
dc.contributor.authorForeman, W.
dc.contributor.authorFurmanski, A. P.
dc.contributor.authorGarcia-Gamez, D.
dc.contributor.authorGarvey, G. T.
dc.contributor.authorGenty, V.
dc.contributor.authorGoeldi, D.
dc.contributor.authorGollapinni, S.
dc.contributor.authorGraf, N.
dc.contributor.authorGramellini, E.
dc.contributor.authorGreenlee, H.
dc.contributor.authorGrosso, R.
dc.contributor.authorGuenette, R.
dc.contributor.authorHackenburg, A.
dc.contributor.authorHamilton, P.
dc.contributor.authorHewes, J.
dc.contributor.authorHill, C.
dc.contributor.authorHo, J.
dc.contributor.authorHorton-Smith, G.
dc.contributor.authorHourlier, A.
dc.contributor.authorHuang, E.-C.
dc.contributor.authorJames, C.
dc.contributor.authorJan de Vries, J.
dc.contributor.authorJen, C.-M.
dc.contributor.authorJiang, L.
dc.contributor.authorJohnson, R. A.
dc.contributor.authorJoshi, J.
dc.contributor.authorJostlein, H.
dc.contributor.authorKaleko, D.
dc.contributor.authorKaragiorgi, G.
dc.contributor.authorKetchum, W.
dc.contributor.authorKirby, B.
dc.contributor.authorKirby, M.
dc.contributor.authorKobilarcik, T.
dc.contributor.authorKreslo, I.
dc.contributor.authorLaube, A.
dc.contributor.authorLi, S.
dc.contributor.authorLi, Y.
dc.contributor.authorLister, A.
dc.contributor.authorLittlejohn, B. R.
dc.contributor.authorLockwitz, S.
dc.contributor.authorLorca, D.
dc.contributor.authorLouis, W. C.
dc.contributor.authorLuethi, M.
dc.contributor.authorLundberg, B.
dc.contributor.authorLuo, X.
dc.contributor.authorMarchionni, A.
dc.contributor.authorMariani, C.
dc.contributor.authorMarshall, J.
dc.contributor.authorMartinez Caicedo, D. A.
dc.contributor.authorMeddage, V.
dc.contributor.authorMiceli, T.
dc.contributor.authorMills, G. B.
dc.contributor.authorMooney, M.
dc.contributor.authorMoore, C. D.
dc.contributor.authorMousseau, J.
dc.contributor.authorMurrells, R.
dc.contributor.authorNaples, D.
dc.contributor.authorNienaber, P.
dc.contributor.authorNowak, J.
dc.contributor.authorPalamara, O.
dc.contributor.authorPaolone, V.
dc.contributor.authorPapavassiliou, V.
dc.contributor.authorPate, S. F.
dc.contributor.authorPavlovic, Z.
dc.contributor.authorPiasetzky, E.
dc.contributor.authorPorzio, D.
dc.contributor.authorPulliam, G.
dc.contributor.authorQian, X.
dc.contributor.authorRaaf, J. L.
dc.contributor.authorRadeka, V.
dc.contributor.authorRafique, A.
dc.contributor.authorRescia, S.
dc.contributor.authorRochester, L.
dc.contributor.authorvon Rohr, C. Rudolf
dc.contributor.authorRussell, B.
dc.contributor.authorSchmitz, D. W.
dc.contributor.authorSchukraft, A.
dc.contributor.authorSeligman, W.
dc.contributor.authorShaevitz, M. H.
dc.contributor.authorSinclair, J.
dc.contributor.authorSmith, A.
dc.contributor.authorSnider, E. L.
dc.contributor.authorSoderberg, M.
dc.contributor.authorSöldner-Rembold, S.
dc.contributor.authorSoleti, S. R.
dc.contributor.authorSpentzouris, P.
dc.contributor.authorSpitz, J.
dc.contributor.authorJohn, J. St.
dc.contributor.authorStrauss, T.
dc.contributor.authorSzelc, A. M.
dc.contributor.authorTagg, N.
dc.contributor.authorTerao, K.
dc.contributor.authorThomson, M.
dc.contributor.authorThorn, C.
dc.contributor.authorToups, M.
dc.contributor.authorTsai, Y.-T.
dc.contributor.authorTufanli, S.
dc.contributor.authorUsher, T.
dc.contributor.authorVan De Pontseele, W.
dc.contributor.authorVan de Water, R.G.
dc.contributor.authorViren, B.
dc.contributor.authorWeber, M.
dc.contributor.authorWickremasinghe, D. A.
dc.contributor.authorWolbers, S.
dc.contributor.authorWoodruff, K.
dc.contributor.authorYang, T.
dc.contributor.authorYates, L.
dc.contributor.authorYu, B.
dc.contributor.authorZeller, G. P.
dc.contributor.authorZennamo, J.
dc.contributor.authorZhang, C.
dc.contributor.authorCollin, G. H.
dc.contributor.authorConrad, Janet Marie
dc.contributor.authorHen, Or
dc.contributor.authorMoon, Jarrett S.
dc.contributor.authorWongjirad, Taritree
dc.date.accessioned2019-03-15T18:56:59Z
dc.date.available2019-03-15T18:56:59Z
dc.date.issued2017-08
dc.identifier.issn1748-0221
dc.identifier.urihttp://hdl.handle.net/1721.1/120996
dc.description.abstractThe low-noise operation of readout electronics in a liquid argon time projection chamber (LArTPC) is critical to properly extract the distribution of ionization charge deposited on the wire planes of the TPC, especially for the induction planes. This paper describes the characteristics and mitigation of the observed noise in the MicroBooNE detector. The MicroBooNE's single-phase LArTPC comprises two induction planes and one collection sense wire plane with a total of 8256 wires. Current induced on each TPC wire is amplified and shaped by custom low-power, low-noise ASICs immersed in the liquid argon. The digitization of the signal waveform occurs outside the cryostat. Using data from the first year of MicroBooNE operations, several excess noise sources in the TPC were identified and mitigated. The residual equivalent noise charge (ENC) after noise filtering varies with wire length and is found to be below 400 electrons for the longest wires (4.7 m). The response is consistent with the cold electronics design expectations and is found to be stable with time and uniform over the functioning channels. This noise level is significantly lower than previous experiments utilizing warm front-end electronics. Keywords: Cold Electronics; Noise; MicroBooNE; Time projection chambers; Noble liquid detectors; Neutrino detectorsen_US
dc.publisherIOP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1748-0221/12/08/P08003en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleNoise Characterization and Filtering in the MicroBooNE Liquid Argon TPCen_US
dc.typeArticleen_US
dc.identifier.citationAcciarri, R. et al. “Noise Characterization and Filtering in the MicroBooNE Liquid Argon TPC.” Journal of Instrumentation 12, 8 (August 2017): P08003–P08003 © 2017 IOP Publishing Ltd and Sissa Medialaben_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorCollin, G. H.
dc.contributor.mitauthorConrad, Janet Marie
dc.contributor.mitauthorHen, Or
dc.contributor.mitauthorMoon, Jarrett S.
dc.contributor.mitauthorWongjirad, Taritree
dc.relation.journalJournal of Instrumentationen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-03-15T13:29:11Z
dspace.orderedauthorsAcciarri, R.; Adams, C.; An, R.; Anthony, J.; Asaadi, J.; Auger, M.; Bagby, L.; Balasubramanian, S.; Baller, B.; Barnes, C.; Barr, G.; Bass, M.; Bay, F.; Bishai, M.; Blake, A.; Bolton, T.; Bullard, B.; Camilleri, L.; Caratelli, D.; Carls, B.; Fernandez, R. Castillo; Cavanna, F.; Chen, H.; Church, E.; Cianci, D.; Cohen, E.; Collin, G. H.; Conrad, J. M.; Convery, M.; Crespo-Anadón, J. I.; Geronimo, G. De; Tutto, M. Del; Devitt, D.; Dytman, S.; Eberly, B.; Ereditato, A.; Sanchez, L. Escudero; Esquivel, J.; Fadeeva, A.A.; Fleming, B.T.; Foreman, W.; Furmanski, A.P.; Garcia-Gamez, D.; Garvey, G.T.; Genty, V.; Goeldi, D.; Gollapinni, S.; Graf, N.; Gramellini, E.; Greenlee, H.; Grosso, R.; Guenette, R.; Hackenburg, A.; Hamilton, P.; Hen, O.; Hewes, J.; Hill, C.; Ho, J.; Horton-Smith, G.; Hourlier, A.; Huang, E.-C.; James, C.; de Vries, J. Jan; Jen, C.-M.; Jiang, L.; Johnson, R.A.; Joshi, J.; Jostlein, H.; Kaleko, D.; Karagiorgi, G.; Ketchum, W.; Kirby, B.; Kirby, M.; Kobilarcik, T.; Kreslo, I.; Laube, A.; Li, S.; Li, Y.; Lister, A.; Littlejohn, B.R.; Lockwitz, S.; Lorca, D.; Louis, W.C.; Luethi, M.; Lundberg, B.; Luo, X.; Marchionni, A.; Mariani, C.; Marshall, J.; Caicedo, D.A. Martinez; Meddage, V.; Miceli, T.; Mills, G. B.; Moon, J.; Mooney, M.; Moore, C. D.; Mousseau, J.; Murrells, R.; Naples, D.; Nienaber, P.; Nowak, J.; Palamara, O.; Paolone, V.; Papavassiliou, V.; Pate, S. F.; Pavlovic, Z.; Piasetzky, E.; Porzio, D.; Pulliam, G.; Qian, X.; Raaf, J. L.; Radeka, V.; Rafique, A.; Rescia, S.; Rochester, L.; Rohr, C. Rudolf von; Russell, B.; Schmitz, D.W.; Schukraft, A.; Seligman, W.; Shaevitz, M.H.; Sinclair, J.; Smith, A.; Snider, E.L.; Soderberg, M.; Söldner-Rembold, S.; Soleti, S.R.; Spentzouris, P.; Spitz, J.; John, J. St.; Strauss, T.; Szelc, A.M.; Tagg, N.; Terao, K.; Thomson, M.; Thorn, C.; Toups, M.; Tsai, Y.-T.; Tufanli, S.; Usher, T.; Pontseele, W. Van De; de Water, R.G. Van; Viren, B.; Weber, M.; Wickremasinghe, D.A.; Wolbers, S.; Wongjirad, T.; Woodruff, K.; Yang, T.; Yates, L.; Yu, B.; Zeller, G.P.; Zennamo, J.; Zhang, C.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-6393-0438
dc.identifier.orcidhttps://orcid.org/0000-0002-4890-6544
dc.identifier.orcidhttps://orcid.org/0000-0002-8346-8375
dc.identifier.orcidhttps://orcid.org/0000-0002-6358-6235
mit.licenseOPEN_ACCESS_POLICYen_US


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