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Reflection phase microscopy using spatio-temporal coherence of light

Author(s)
Choi, Youngwoon; Hosseini, Poorya; Kang, Jeon Woong; Kang, Sungsam; Yang, Taeseok Daniel; Hyeon, Min Gyu; Kim, Beop-Min; So, Peter T. C.; Yaqoob, Zahid; ... Show more Show less
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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Abstract
Many disease states are associated with cellular biomechanical changes as markers. Label-free phase microscopes are used to quantify thermally driven interface fluctuations, which allow the deduction of important cellular rheological properties. Here, the spatio-temporal coherence of light was used to implement a high-speed reflection phase microscope with superior depth selectivity and higher phase sensitivity. Nanometric scale motion of cytoplasmic structures can be visualized with fine details and three-dimensional resolution. Specifically, the spontaneous fluctuation occurring on the nuclear membrane of a living cell was observed at video rate. By converting the reflection phase into displacement, the sensitivity in quantifying nuclear membrane fluctuation was found to be about one nanometer. A reflection phase microscope can potentially elucidate biomechanical mechanisms of pathological and physiological processes.
Date issued
2018-11
URI
http://hdl.handle.net/1721.1/121043
Department
Massachusetts Institute of Technology. Department of Biological Engineering; Massachusetts Institute of Technology. Department of Chemistry; Massachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Spectroscopy Laboratory
Journal
Optica
Publisher
Oxford University Press
Citation
Choi, Youngwoon, Poorya Hosseini, Jeon Woong Kang, Sungsam Kang, Taeseok Daniel Yang, Min Gyu Hyeon, Beop-Min Kim, Peter T. C. So, and Zahid Yaqoob. “Reflection Phase Microscopy Using Spatio-Temporal Coherence of Light.” Optica 5, no. 11 (November 15, 2018): 1468.
Version: Final published version
ISSN
2334-2536

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