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dc.contributor.authorOuyang, Tom Yu
dc.contributor.authorDavis, Randall
dc.date.accessioned2019-05-20T16:03:43Z
dc.date.available2019-05-20T16:03:43Z
dc.date.issued2009
dc.date.submitted2008
dc.identifier.isbn9781605609492
dc.identifier.urihttps://hdl.handle.net/1721.1/121162
dc.description.abstractWe propose a new sketch recognition framework that combines a rich representation of low level visual appearance with a graphical model for capturing high level relationships between symbols. This joint model of appearance and context allows our framework to be less sensitive to noise and drawing variations, improving accuracy and robustness. The result is a recognizer that is better able to handle the wide range of drawing styles found in messy freehand sketches. We evaluate our work on two real-world domains, molecular diagrams and electrical circuit diagrams, and show that our combined approach significantly improves recognition performance.en_US
dc.language.isoen
dc.publisherNeural Information Processing Systems Foundation, Inc.en_US
dc.relation.isversionofhttps://papers.nips.cc/paper/3885-learning-from-neighboring-strokes-combining-appearance-and-context-for-multi-domain-sketch-recognitionen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceNeural Information Processing Systems (NIPS)en_US
dc.titleLearning from neighboring strokes: Combining appearance and context for multi-domain sketch recognitionen_US
dc.typeArticleen_US
dc.identifier.citationOuyand, Tom Y. and Randall Davis. "Learning from Neighboring Strokes: Combing Appearance and Context for Multi-Domain Sketch Recognition." Advances in Neural Information Processing Systems 22 (NIPS 2009), December 2008, Vancouver, B.C., Canada, edited by D. Koller, Neural Information Processing Systems Foundation, Inc., 2009.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalAdvances in Neural Information Processing Systems 22 (NIPS 2008)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-05-16T13:02:32Z
dspace.date.submission2019-05-16T13:02:33Z


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