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Ligand-field helical luminescence in a 2D ferromagnetic insulator

Author(s)
Seyler, Kyle L.; Zhong, Ding; Klein, Dahlia Rivka; Gao, Shiyuan; Zhang, Xiaoou; Huang, Bevin; Navarro Moratalla, Efren Adolfo; Yang, Li; Cobden, David H.; McGuire, Michael A.; Yao, Wang; Xiao, Di; Xu, Xiaodong; Jarillo-Herrero, Pablo; ... Show more Show less
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Abstract
Bulk chromium tri-iodide (CrI₃) has long been known as a layered van der Waals ferromagnet. However, its monolayer form was only recently isolated and confirmed to be a truly two-dimensional (2D) ferromagnet, providing a new platform for investigating light-matter interactions and magneto-optical phenomena in the atomically thin limit. Here, we report spontaneous circularly polarized photoluminescence in monolayer CrI₃ under linearly polarized excitation, with helicity determined by the monolayer magnetization direction. In contrast, the bilayer CrI₃ photoluminescence exhibits vanishing circular polarization, supporting the recently uncovered anomalous antiferromagnetic interlayer coupling in Crl₃ bilayers. Distinct from the Wannier-Mott excitons that dominate the optical response in well-known 2D van der Waals semiconductors , our absorption and layer-dependent photoluminescence measurements reveal the importance of ligand-field and charge-transfer transitions to the optoelectronic response of atomically thin CrI₃. We attribute the photoluminescence to a parity-forbidden d-d transition characteristic of Cr³⁺ complexes, which displays broad linewidth due to strong vibronic coupling and thickness-independent peak energy due to its localized molecular orbital nature.
Date issued
2017-12
URI
https://hdl.handle.net/1721.1/121374
Department
Massachusetts Institute of Technology. Department of Physics; MIT Materials Research Laboratory
Journal
Nature Physics
Publisher
Springer Nature
Citation
Seyler, Kyle L. et al. “Ligand-Field Helical Luminescence in a 2D Ferromagnetic Insulator.” Nature Physics 14, 3 (December 2017): 277–281 © 2017 The Author(s)
Version: Author's final manuscript
ISSN
1745-2473
1745-2481

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