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dc.contributor.authorBiswas, Avishek
dc.contributor.authorArslan, Umut
dc.contributor.authorHamzaoglu, Fatih
dc.contributor.authorChandrakasan, Anantha P
dc.date.accessioned2019-10-08T15:21:37Z
dc.date.available2019-10-08T15:21:37Z
dc.date.issued2017-07
dc.date.submitted2017-04
dc.identifier.isbn9781509051915
dc.identifier.issn2152-3630
dc.identifier.urihttps://hdl.handle.net/1721.1/122465
dc.description.abstractThis paper presents a low-offset read sensing scheme for resistive memories. Due to increasing device variations in sub-32 nm CMOS processes, it becomes very challenging to design a high yield and low-offset read-sensing scheme. In this work we address these issues by using a pseudo-differential sensing scheme to get 2× signal margin and by full offset cancellation of the sense-amplifier, making it more suitable to tolerate variation from the memory array due to storage device resistance variation. Measurement results show the sense-amplifier can work with a 20mV input, which makes it ideal for small-signal sensing for resistive memories.en_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/cicc.2017.7993689en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Chandrakasan via Phoebe Ayersen_US
dc.titleAn offset-cancelling four-phase voltage sense amplifier for resistive memories in 14nm CMOSen_US
dc.typeArticleen_US
dc.identifier.citationBiswas, Avishek et al. "An offset-cancelling four-phase voltage sense amplifier for resistive memories in 14nm CMOS." IEEE Custom Integrated Circuits Conference (CICC), April-May 2017, Austin, Texas, USA, IEEE Custom Integrated Circuits Conference (CICC), July 2017. © 2017 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalIEEE Custom Integrated Circuits Conference (CICC)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.date.submission2019-10-02T15:52:46Z
mit.journal.volume2017en_US


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