| dc.contributor.author | Cheng, Yu-Hsiang | |
| dc.contributor.author | Teitelbaum, Samuel Welch | |
| dc.contributor.author | Gao, Frank | |
| dc.contributor.author | Nelson, Keith Adam | |
| dc.date.accessioned | 2020-01-22T21:04:30Z | |
| dc.date.available | 2020-01-22T21:04:30Z | |
| dc.date.issued | 2019-04-16 | |
| dc.identifier.issn | 2100-014X | |
| dc.identifier.issn | 2101-6275 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/123541 | |
| dc.description.abstract | Crystalline tellurium undergoes amorphization after irradiation with strong femtosecond pulses. Steady-state reflectivity and single-shot transient reflectivity studies suggest the amorphization is due to thermal melting rather than non-thermal switching. | en_US |
| dc.language.iso | en | |
| dc.publisher | EDP Sciences | en_US |
| dc.relation.isversionof | 10.1051/epjconf/201920504011 | en_US |
| dc.rights | Creative Commons Attribution 4.0 International license | en_US |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | en_US |
| dc.source | EPJ Web of Conferences | en_US |
| dc.title | Amorphization in crystalline tellurium by femtosecond pulses | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Cheng, Yu-Hsiang et al. "Amorphization in crystalline tellurium by femtosecond pulses." XXI International Conference on Ultrafast Phenomena 2018 (UP2018), July 2018, Hamburg, Germany, edited by G. Cerullo et al., 2018 | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.relation.journal | EPJ Web of Conferences | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2019-12-30T19:26:17Z | |
| dspace.date.submission | 2019-12-30T19:26:20Z | |
| mit.journal.volume | 205 | en_US |
| mit.metadata.status | Complete | |
