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dc.contributor.authorBoriskina, Svetlana V
dc.contributor.authorTsurimaki, Yoichiro
dc.contributor.authorChen, Gang
dc.date.accessioned2020-02-27T21:18:26Z
dc.date.available2020-02-27T21:18:26Z
dc.date.issued2017
dc.identifier.isbn9781943580309
dc.identifier.urihttps://hdl.handle.net/1721.1/123877
dc.description.abstractWe demonstrate an ultra-thin planar perfect absorber based on the excitation of a topologically-protected interfacial optical state and test its performance as a sensitive optical sensor in both the amplitude and phase detection schemes.en_US
dc.language.isoen
dc.publisherThe Optical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/sensors.2017.sew3e.5en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Gang Chenen_US
dc.titleSingular-Phase Optical Sensing with Topologically-Protected Tamm Interfacial States in Planar Nanostructuresen_US
dc.typeArticleen_US
dc.identifier.citationS. V. Boriskina, Y. Tsurimaki, and G. Chen, "Singular-Phase Optical Sensing with Topologically-Protected Tamm Interfacial States in Planar Nanostructures," in Advanced Photonics 2017 (IPR, NOMA, Sensors, Networks, SPPCom, PS), OSA Technical Digest (online) (Optical Society of America, 2017), paper SeW3E.5.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.relation.journalAdvanced Photonics 2017 (IPR, NOMA, Sensors, Networks, SPPCom, PS),en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2020-02-27T13:35:36Z
dspace.date.submission2020-02-27T13:35:38Z
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusComplete


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