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Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector

Author(s)
Chen, Xi; Hauwiller, Matthew R; Kumar, Abinash; Lebeau, James M
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Abstract
We report an approach to expand the effective number of pixels available to small, two-dimensional electron detectors. To do so, we acquire subsections of a diffraction pattern that are then accurately stitched together in post-processing. Using an electron microscopy pixel array detector (EMPAD) that has only 128 × 128 pixels, we show that the field of view can be expanded while achieving high reciprocal-space sampling. Further, we highlight the need to properly account for the detector position (rotation) and the non-orthonormal diffraction shift axes to achieve an accurate reconstruction. Applying the method, we provide examples of spot and convergent beam diffraction patterns acquired with a pixelated detector.
Date issued
2020-08
URI
https://hdl.handle.net/1721.1/127774
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Journal
Microscopy and Microanalysis
Publisher
Cambridge University Press (CUP)
Citation
Chen, Xi et al. “Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector.” Microscopy and Microanalysis, 11, (August 2020): 1-6 © 2020 The Author(s)
Version: Author's final manuscript
ISSN
1431-9276

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