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Combining time-resolved optical (TOS), electronic (trARPES) and structural (UED) probes on the class of rare earth tritellurides RTe₃

dc.contributor.authorRohwer, Timm
dc.contributor.authorZong, Alfred
dc.contributor.authorKogar, Anshul
dc.contributor.authorBie, Yaqing
dc.contributor.authorLee, Changmin
dc.contributor.authorBaldini, Edoardo
dc.contributor.authorErgecen, Emre
dc.contributor.authorYilmaz, Mehmet B
dc.contributor.authorFreelon, Byron
dc.contributor.authorSie, Edbert Jarvis
dc.contributor.authorZhou, Hengyun
dc.contributor.authorJarillo-Herrero, Pablo
dc.contributor.authorGedik, Nuh
dc.date.accessioned2020-11-30T12:58:32Z
dc.date.available2020-11-30T12:58:32Z
dc.date.issued2019-04
dc.identifier.issn2100-014X
dc.identifier.urihttps://hdl.handle.net/1721.1/128669
dc.description.abstractThe combination of EUV based time-resolved Angle-Resolved-Photo-Electron-Spectroscopy (trARPES), Ultrafast-Electron-Diffraction (UED) and Transient-Optical-Spectroscopy (TOS) facilitates a comprehensive study and all-embracing analysis of correlated dynamics, exemplified on the system of Charge-Density-Waves (CDW’s) in rare earth tritellurides (RTe3).en_US
dc.language.isoen
dc.publisherEDP Sciencesen_US
dc.relation.isversionof10.1051/EPJCONF/201920504009en_US
dc.rightsCreative Commons Attribution 4.0 International licenseen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceEPJ Web of Conferencesen_US
dc.titleCombining time-resolved optical (TOS), electronic (trARPES) and structural (UED) probes on the class of rare earth tritellurides RTe₃en_US
dc.typeArticleen_US
dc.identifier.citationRohwer, Timm et al. “Combining time-resolved optical (TOS), electronic (trARPES) and structural (UED) probes on the class of rare earth tritellurides RTe₃.” EPJ Web of Conferences, 205 (April 2019): 04009 © 2019 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalEPJ Web of Conferencesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2020-10-23T18:19:07Z
dspace.orderedauthorsRohwer, T; Zong, A; Kogar, A; Bie, Y-Q; Lee, C; Baldini, E; Ergecen, E; Yilmaz, MB; Freelon, B; Sie, EJ; Zhou, H; Straquadine, J; Walmsley, P; Dolgirev, PE; Rozhkov, AV; Fisher, IR; Jarillo-Herrero, P; Fine, BV; Gedik, Nen_US
dspace.date.submission2020-10-23T18:19:17Z
mit.journal.volume205en_US
mit.licensePUBLISHER_CC
mit.metadata.statusComplete


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