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dc.contributor.authorLu, Tsung-Ju
dc.contributor.authorEnglund, Dirk R.
dc.date.accessioned2021-02-02T16:54:57Z
dc.date.available2021-02-02T16:54:57Z
dc.date.issued2019-04
dc.identifier.isbn9781510626294
dc.identifier.isbn9781510626300
dc.identifier.urihttps://hdl.handle.net/1721.1/129628
dc.description.abstractLow loss coupling to optical waveguides is one of the on-going challenges with integrated photonics. Edge coupling of fibers or fiber arrays allows for in principle low loss coupling but strongly depends on the optical facet quality. We demonstrate an innovative strategy utilizing ion milling for polishing photonic integrated circuit edge facets for direct optical coupling to waveguides. Specifically, the authors created a 750 μm wide by 130 μm deep polished facet for coupling SM300 fiber to AlN waveguides on Al2O3 substrates; all capped with an index matched, but highly stressed, SiON cladding. Ion milling avoids the lateral shear forces that can delaminate a stressed film, resulting in scattering sites at the tapered edge coupler/facet interface. The authors demonstrate that a mechanical polish produced chipped facets that scattered the light away from the waveguide, thus requiring reprocessing of the chip. After ion milling, the authors coupled light into the waveguides and demonstrate critical coupling into AlN microring resonators between 390 and 395 nm.en_US
dc.description.sponsorshipUnited States. Air Force Research Laboratory (Grant FA8650-15-2-5220)en_US
dc.language.isoen
dc.publisherSPIE-Intl Soc Optical Engen_US
dc.relation.isversionof10.1117/12.2523433en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleIon milled facet for direct coupling to optical waveguidesen_US
dc.typeArticleen_US
dc.identifier.citationThomas, Paul M. et al. “Ion milled facet for direct coupling to optical waveguides.” Paper in the Proceedings of SPIE - The International Society for Optical Engineering, 10982, Micro- and Nanotechnology Sensors, Systems, and Applications XI, Baltimore, Md, 14-18 April 2019, SPIE: 109823H © 2019 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2020-12-14T17:34:51Z
dspace.orderedauthorsThomas, PM; Fanto, M; Serafini, JR; Steidle, J; Preble, S; Lu, T-J; Englund, Den_US
dspace.date.submission2020-12-14T17:34:57Z
mit.journal.volume10982en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusComplete


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