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dc.contributor.authorDaskalakis, Constantinos
dc.contributor.authorDikkala, Sai Nishanth
dc.date.accessioned2021-02-24T14:19:30Z
dc.date.available2021-02-24T14:19:30Z
dc.date.issued2019-11
dc.identifier.issn0018-9448
dc.identifier.urihttps://hdl.handle.net/1721.1/129990
dc.description.abstractGiven samples from an unknown multivariate distribution p, is it possible to distinguish whether p is the product of its marginals versus p being far from every product distribution? Similarly, is it possible to distinguish whether p equals a given distribution q versus p and q being far from each other? These problems of testing independence and goodness-of-fit have received enormous attention in statistics, information theory, and theoretical computer science, with sample-optimal algorithms known in several interesting regimes of parameters. Unfortunately, it has also been understood that these problems become intractable in large dimensions, necessitating exponential sample complexity. Motivated by the exponential lower bounds for general distributions as well as the ubiquity of Markov random fields (MRFs) in the modeling of high-dimensional distributions, we initiate the study of distribution testing on structured multivariate distributions, and in particular, the prototypical example of MRFs: the Ising Model. We demonstrate that, in this structured setting, we can avoid the curse of dimensionality, obtaining sample, and time efficient testers for independence and goodness-of-fit. One of the key technical challenges we face along the way is bounding the variance of functions of the Ising model.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grants CCF-1551875, CCF-1617730, CCF-1650733)en_US
dc.description.sponsorshipUnited States. Office of Naval Research (Grant N00014-12-1-0999)en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/TIT.2019.2932255en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleTesting Ising Modelsen_US
dc.typeArticleen_US
dc.identifier.citationDaskalakis, Constantinos et al. “Testing Ising Models.” IEEE Transactions on Information Theory, 65, 11 (November 2019): 6829 - 6852 © 2019 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalIEEE Transactions on Information Theoryen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2020-12-07T17:49:27Z
dspace.orderedauthorsDaskalakis, C; Dikkala, N; Kamath, Gen_US
dspace.date.submission2020-12-07T17:49:29Z
mit.journal.volume65en_US
mit.journal.issue11en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusComplete


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