dc.contributor.author | Han, Ningren | |
dc.contributor.author | West, Gavin Neal | |
dc.contributor.author | Atabaki, Amir H | |
dc.contributor.author | Burghoff, David Patrick | |
dc.contributor.author | Ram, Rajeev J | |
dc.date.accessioned | 2021-03-05T19:23:02Z | |
dc.date.available | 2021-03-05T19:23:02Z | |
dc.date.issued | 2019-08 | |
dc.date.submitted | 2019-07 | |
dc.identifier.issn | 0146-9592 | |
dc.identifier.issn | 1539-4794 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/130095 | |
dc.description.abstract | Precise knowledge of a laser’s wavelength is crucial for applications from spectroscopy to telecommunications. Here, we present a wavemeter that operates on the Talbot effect. Tone parameter extraction algorithms are used to retrieve the frequency of the periodic signal obtained in the sampled Talbot interferogram. Theoretical performance analysis based on the Cramér–Rao lower bound as well as experimental results are presented and discussed. With this scheme, we experimentally demonstrate a compact and high-precision wavemeter with below 10 pm single-shot estimation uncertainty under the 3–σ criterion around 780 nm. | en_US |
dc.language.iso | en | |
dc.publisher | The Optical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1364/ol.44.004187 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | arXiv | en_US |
dc.title | Compact and high-precision wavemeters using the Talbot effect and signal processing | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Han, Ningren et al. "Compact and high-precision wavemeters using the Talbot effect and signal processing." Optics Letters 44, 17 (August 2019): 4187-4190. © 2019 Optical Society of America | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
dc.relation.journal | Optics Letters | en_US |
dc.eprint.version | Original manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dc.date.updated | 2021-02-04T17:20:31Z | |
dspace.orderedauthors | Han, N; West, GN; Atabaki, AH; Burghoff, D; Ram, RJ | en_US |
dspace.date.submission | 2021-02-04T17:20:42Z | |
mit.journal.volume | 44 | en_US |
mit.journal.issue | 17 | en_US |
mit.license | OPEN_ACCESS_POLICY | |
mit.metadata.status | Complete | |