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dc.contributor.authorHolm, Elizabeth A
dc.contributor.authorCohn, Ryan
dc.contributor.authorGao, Nan
dc.contributor.authorKitahara, Andrew R
dc.contributor.authorMatson, Thomas P
dc.contributor.authorLei, Bo
dc.contributor.authorYarasi, Srujana R
dc.date.accessioned2021-09-20T17:31:00Z
dc.date.available2021-09-20T17:31:00Z
dc.date.issued2020-09-29
dc.identifier.urihttps://hdl.handle.net/1721.1/131932
dc.description.abstractAbstract Microstructural characterization and analysis is the foundation of microstructural science, connecting materials structure to composition, process history, and properties. Microstructural quantification traditionally involves a human deciding what to measure and then devising a method for doing so. However, recent advances in computer vision (CV) and machine learning (ML) offer new approaches for extracting information from microstructural images. This overview surveys CV methods for numerically encoding the visual information contained in a microstructural image using either feature-based representations or convolutional neural network (CNN) layers, which then provides input to supervised or unsupervised ML algorithms that find associations and trends in the high-dimensional image representation. CV/ML systems for microstructural characterization and analysis span the taxonomy of image analysis tasks, including image classification, semantic segmentation, object detection, and instance segmentation. These tools enable new approaches to microstructural analysis, including the development of new, rich visual metrics and the discovery of processing-microstructure-property relationships.en_US
dc.publisherSpringer USen_US
dc.relation.isversionofhttps://doi.org/10.1007/s11661-020-06008-4en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSpringer USen_US
dc.titleOverview: Computer Vision and Machine Learning for Microstructural Characterization and Analysisen_US
dc.typeArticleen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2020-11-13T04:31:51Z
dc.language.rfc3066en
dc.rights.holderThe Minerals, Metals & Materials Society and ASM International
dspace.embargo.termsY
dspace.date.submission2020-11-13T04:31:51Z
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Needed


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