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dc.contributor.authorRidley, Gavin
dc.contributor.authorForget, Benoit
dc.date.accessioned2021-09-20T17:41:52Z
dc.date.available2021-09-20T17:41:52Z
dc.date.issued2021-03-30
dc.identifier.urihttps://hdl.handle.net/1721.1/132084
dc.description.abstractAbstract We derive a probability distribution for the possible number of iterations required for a SIMT (single instruction multiple thread) program using rejection sampling to finish creating a sample across all threads. This distribution is found to match a recently proposed distribution from Chakraborty and Gupta (in: Communications in statistics: theory and methods, 2015) that was shown as a good approximation of certain datasets. This work demonstrates an exact application of this distribution. The distribution can be used to evaluate the relative merit of some sampling methods on the GPU without resort to numerical tests. The distribution reduces to the expected geometric distribution in the single thread per warp limit. A simplified formula to approximate the expected number of iterations required to obtain rejection iteration samples is provided. With this new result, a simple, efficient layout for assigning sampling tasks to threads on a GPU is found as a function of the rejection probability without recourse to more complicated rejection sampling methods.en_US
dc.publisherSpringer USen_US
dc.relation.isversionofhttps://doi.org/10.1007/s11222-021-10003-zen_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceSpringer USen_US
dc.titleA simple method for rejection sampling efficiency improvement on SIMT architecturesen_US
dc.typeArticleen_US
dc.identifier.citationStatistics and Computing. 2021 Mar 30;31(3):30en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineering
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2021-03-31T03:35:18Z
dc.language.rfc3066en
dc.rights.holderThe Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature
dspace.embargo.termsY
dspace.date.submission2021-03-31T03:35:18Z
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Needed


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