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Chromatic interferometry with small frequency differences
dc.contributor.author | Qu, LY | |
dc.contributor.author | Liu, LC | |
dc.contributor.author | Cotler, J | |
dc.contributor.author | Ma, F | |
dc.contributor.author | Guan, JY | |
dc.contributor.author | Zheng, MY | |
dc.contributor.author | Yao, Q | |
dc.contributor.author | Xie, X | |
dc.contributor.author | Chen, YA | |
dc.contributor.author | Zhang, Q | |
dc.contributor.author | Wilczek, F | |
dc.contributor.author | Pan, JW | |
dc.date.accessioned | 2021-09-20T18:23:07Z | |
dc.date.available | 2021-09-20T18:23:07Z | |
dc.identifier.uri | https://hdl.handle.net/1721.1/132572 | |
dc.description.abstract | © 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. By developing a 'two-crystal' method for color erasure, we can broaden the scope of chromatic interferometry to include optical photons whose frequency difference falls outside of the 400 nm to 4500 nm wavelength range, which is the passband of a PPLN crystal. We demonstrate this possibility experimentally, by observing interference patterns between sources at 1064.4 nm and 1063.6 nm, corresponding to a frequency difference of about 200 GHz. | en_US |
dc.language.iso | en | |
dc.publisher | The Optical Society | en_US |
dc.relation.isversionof | 10.1364/OE.402560 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | OSA Publishing | en_US |
dc.title | Chromatic interferometry with small frequency differences | en_US |
dc.type | Article | en_US |
dc.relation.journal | Optics Express | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2020-11-17T14:38:31Z | |
dspace.orderedauthors | Qu, LY; Liu, LC; Cotler, J; Ma, F; Guan, JY; Zheng, MY; Yao, Q; Xie, X; Chen, YA; Zhang, Q; Wilczek, F; Pan, JW | en_US |
dspace.date.submission | 2020-11-17T14:38:37Z | |
mit.journal.volume | 28 | en_US |
mit.journal.issue | 22 | en_US |
mit.license | PUBLISHER_POLICY | |
mit.metadata.status | Authority Work and Publication Information Needed |