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dc.contributor.authorCarr, R.
dc.date.accessioned2021-09-28T17:36:18Z
dc.date.available2021-09-28T17:36:18Z
dc.date.issued2018-07
dc.identifier.issn1748-0221
dc.identifier.urihttps://hdl.handle.net/1721.1/132654
dc.description.abstract© 2018 IOP Publishing Ltd and Sissa Medialab. The single-phase liquid argon time projection chamber (LArTPC) provides a large amount of detailed information in the form of fine-grained drifted ionization charge from particle traces. To fully utilize this information, the deposited charge must be accurately extracted from the raw digitized waveforms via a robust signal processing chain. Enabled by the ultra-low noise levels associated with cryogenic electronics in the MicroBooNE detector, the precise extraction of ionization charge from the induction wire planes in a single-phase LArTPC is qualitatively demonstrated on MicroBooNE data with event display images, and quantitatively demonstrated via waveform-level and track-level metrics. Improved performance of induction plane calorimetry is demonstrated through the agreement of extracted ionization charge measurements across different wire planes for various event topologies. In addition to the comprehensive waveform-level comparison of data and simulation, a calibration of the cryogenic electronics response is presented and solutions to various MicroBooNE-specific TPC issues are discussed. This work presents an important improvement in LArTPC signal processing, the foundation of reconstruction and therefore physics analyses in MicroBooNE.en_US
dc.publisherIOP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1748-0221/13/07/P07007en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleIonization electron signal processing in single phase LArTPCs. Part II. Data/simulation comparison and performance in MicroBooNEen_US
dc.typeArticleen_US
dc.identifier.citationAdams, C. et al. “Ionization Electron Signal Processing in Single Phase LArTPCs. Part II. Data/simulation Comparison and Performance in MicroBooNE.” Journal of Instrumentation 13, 7 (July 2018):.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.relation.journalJournal of Instrumentationen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-03-15T15:02:04Z
dspace.orderedauthorsAdams, C.; An, R.; Anthony, J.; Asaadi, J.; Auger, M.; Balasubramanian, S.; Baller, B.; Barnes, C.; Barr, G.; Bass, M.; Bay, F.; Bhat, A.; Bhattacharya, K.; Bishai, M.; Blake, A.; Bolton, T.; Camilleri, L.; Caratelli, D.; Terrazas, I. Caro; Carr, R.; Fernandez, R. Castillo; Cavanna, F.; Cerati, G.; Chen, H.; Chen, Y.; Church, E.; Cianci, D.; Cohen, E.; Collin, G.H.; Conrad, J.M.; Convery, M.; Cooper-Troendle, L.; Crespo-Anadón, J.I.; Tutto, M. Del; Devitt, D.; Diaz, A.; Dolce, M.; Dytman, S.; Eberly, B.; Ereditato, A.; Sanchez, L. Escudero; Esquivel, J.; Evans, J.J; Fadeeva, A.A.; Fleming, B.T.; Foreman, W.; Furmanski, A.P.; Garcia-Gamez, D.; Garvey, G.T.; Genty, V.; Goeldi, D.; Gollapinni, S.; Gramellini, E.; Greenlee, H.; Grosso, R.; Guenette, R.; Guzowski, P.; Hackenburg, A.; Hamilton, P.; Hen, O.; Hewes, J.; Hill, C.; Ho, J.; Horton-Smith, G.A.; Hourlier, A.; Huang, E.-C.; James, C.; de Vries, J. Jan; Jiang, L.; Johnson, R.A.; Joshi, J.; Jostlein, H.; Jwa, Y.-J.; Kaleko, D.; Karagiorgi, G.; Ketchum, W.; Kirby, B.; Kirby, M.; Kobilarcik, T.; Kreslo, I.; Li, Y.; Lister, A.; Littlejohn, B.R.; Lockwitz, S.; Lorca, D.; Louis, W.C.; Luethi, M.; Lundberg, B.; Luo, X.; Marchionni, A.; Marcocci, S.; Mariani, C.; Marshall, J.; Caicedo, D.A. Martinez; Mastbaum, A.; Meddage, V.; Mettler, T.; Miceli, T.; Mills, G.B.; Mogan, A.; Moon, J.; Mooney, M.; Moore, C.D.; Mousseau, J.; Murphy, M.; Murrells, R.; Naples, D.; Nienaber, P.; Nowak, J.; Palamara, O.; Pandey, V.; Paolone, V.; Papadopoulou, A.; Papavassiliou, V.; Pate, S. F.; Pavlovic, Z.; Piasetzky, E.; Porzio, D.; Pulliam, G.; Qian, X.; Raaf, J.L.; Radeka, V.; Rafique, A.; Rochester, L.; Ross-Lonergan, M.; Rohr, C. Rudolf von; Russell, B.; Schmitz, D. W.; Schukraft, A.; Seligman, W.; Shaevitz, M.H.; Sinclair, J.; Smith, A.; Snider, E.L.; Soderberg, M.; Söldner-Rembold, S.; Soleti, S.R.; Spentzouris, P.; Spitz, J.; John, J. St.; Strauss, T.; Sutton, K.; Sword-Fehlberg, S.; Szelc, A.M.; Tagg, N.; Tang, W.; Terao, K.; Thomson, M.; Toups, M.; Tsai, Y.-T.; Tufanli, S.; Usher, T.; Pontseele, W. Van De; de Water, R.G. Van; Viren, B.; Weber, M.; Wei, H.; Wickremasinghe, D.A.; Wierman, K.; Williams, Z.; Wolbers, S.; Wongjirad, T.; Woodruff, K.; Yang, T.; Yarbrough, G.; Yates, L. E.; Yu, B.; Zeller, G.P.; Zennamo, J.; Zhang, C.en_US
dspace.embargo.termsNen_US
dspace.date.submission2019-04-04T16:04:05Z
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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