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dc.contributor.authorHan, Bingnan
dc.contributor.authorLin, Yuxuan
dc.contributor.authorYang, Yafang
dc.contributor.authorMao, Nannan
dc.contributor.authorLi, Wenyue
dc.contributor.authorWang, Haozhe
dc.contributor.authorYasuda, Kenji
dc.contributor.authorWang, Xirui
dc.contributor.authorFatemi, Valla
dc.contributor.authorZhou, Lin
dc.contributor.authorWang, Joel I-Jan
dc.contributor.authorMa, Qiong
dc.contributor.authorCao, Yuan
dc.contributor.authorRodan-Legrain, Daniel
dc.contributor.authorBie, Ya-Qing
dc.contributor.authorNavarro-Moratalla, Efrén
dc.contributor.authorKlein, Dahlia
dc.contributor.authorMacNeill, David
dc.contributor.authorWu, Sanfeng
dc.contributor.authorKitadai, Hikari
dc.contributor.authorLing, Xi
dc.contributor.authorJarillo-Herrero, Pablo
dc.contributor.authorKong, Jing
dc.contributor.authorYin, Jihao
dc.contributor.authorPalacios, Tomás
dc.date.accessioned2021-10-27T19:54:10Z
dc.date.available2021-10-27T19:54:10Z
dc.date.issued2020
dc.identifier.urihttps://hdl.handle.net/1721.1/133692
dc.description.abstract© 2020 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Advanced microscopy and/or spectroscopy tools play indispensable roles in nanoscience and nanotechnology research, as they provide rich information about material processes and properties. However, the interpretation of imaging data heavily relies on the “intuition” of experienced researchers. As a result, many of the deep graphical features obtained through these tools are often unused because of difficulties in processing the data and finding the correlations. Such challenges can be well addressed by deep learning. In this work, the optical characterization of 2D materials is used as a case study, and a neural-network-based algorithm is demonstrated for the material and thickness identification of 2D materials with high prediction accuracy and real-time processing capability. Further analysis shows that the trained network can extract deep graphical features such as contrast, color, edges, shapes, flake sizes, and their distributions, based on which an ensemble approach is developed to predict the most relevant physical properties of 2D materials. Finally, a transfer learning technique is applied to adapt the pretrained network to other optical identification applications. This artificial-intelligence-based material characterization approach is a powerful tool that would speed up the preparation, initial characterization of 2D materials and other nanomaterials, and potentially accelerate new material discoveries.
dc.language.isoen
dc.publisherWiley
dc.relation.isversionof10.1002/ADMA.202000953
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/
dc.sourcearXiv
dc.titleDeep‐Learning‐Enabled Fast Optical Identification and Characterization of 2D Materials
dc.typeArticle
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronics
dc.relation.journalAdvanced Materials
dc.eprint.versionOriginal manuscript
dc.type.urihttp://purl.org/eprint/type/JournalArticle
eprint.statushttp://purl.org/eprint/status/NonPeerReviewed
dc.date.updated2020-10-29T15:19:06Z
dspace.orderedauthorsHan, B; Lin, Y; Yang, Y; Mao, N; Li, W; Wang, H; Yasuda, K; Wang, X; Fatemi, V; Zhou, L; Wang, JI-J; Ma, Q; Cao, Y; Rodan-Legrain, D; Bie, Y-Q; Navarro-Moratalla, E; Klein, D; MacNeill, D; Wu, S; Kitadai, H; Ling, X; Jarillo-Herrero, P; Kong, J; Yin, J; Palacios, T
dspace.date.submission2020-10-29T15:19:20Z
mit.journal.volume32
mit.journal.issue29
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Needed


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