Active Polarimetric Measurements for Identification and Characterization of Space Debris

Abstract

© 1965-2011 IEEE. A bench-top polarimeter (λ = 1064 nm) is used to measure the polarimetric bidirectional reflectance distribution function of several common spacecraft materials in both bistatic and monostatic geometries. The Mueller matrix and polarimetric properties of each material were estimated as a function of the illumination and viewing angles. The findings expand upon previous research suggesting that active polarimetry may be useful for the remote characterization and identification of space debris.