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dc.contributor.authorGkioulekas, Ioannis
dc.contributor.authorLevin, Anat
dc.contributor.authorDurand, Fredo
dc.contributor.authorZickler, Todd
dc.date.accessioned2022-07-08T17:00:06Z
dc.date.available2021-10-27T20:06:00Z
dc.date.available2022-07-08T17:00:06Z
dc.date.issued2015
dc.identifier.urihttps://hdl.handle.net/1721.1/134650.2
dc.description.abstractCopyright 2015 ACM. We present a computational imaging system, inspired by the optical coherence tomography (OCT) framework, that uses interferometry to produce decompositions of light transport in small scenes or volumes. The system decomposes transport according to various attributes of the paths that photons travel through the scene, including where on the source the paths originate, their pathlengths from source to camera through the scene, their wavelength, and their polarization. Since it uses interference, the system can achieve high pathlength resolutions, with the ability to distinguish paths whose lengths differ by as little as ten microns. We describe how to construct and optimize an optical assembly for this technique, and we build a prototype to measure and visualize three-dimensional shape, direct and indirect reflection components, and properties of scattering, refractive/dispersive, and birefringent materials.en_US
dc.language.isoen
dc.publisherAssociation for Computing Machinery (ACM)en_US
dc.relation.isversionof10.1145/2766928en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceother univ websiteen_US
dc.titleMicron-scale light transport decomposition using interferometryen_US
dc.typeArticleen_US
dc.identifier.citationGkioulekas, Ioannis, et al. "Micron-Scale Light Transport Decomposition Using Interferometry." Acm Transactions on Graphics 34 4 (2015).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalACM Transactions on Graphicsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-05-29T12:29:36Z
dspace.orderedauthorsGkioulekas, I; Levin, A; Durand, F; Zickler, Ten_US
dspace.date.submission2019-05-29T12:29:38Z
mit.journal.volume34en_US
mit.journal.issue4en_US
mit.metadata.statusPublication Information Neededen_US


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