| dc.contributor.author | de Castro, Leo | |
| dc.contributor.author | Lo, Andrew W | |
| dc.contributor.author | Reynolds, Taylor W | |
| dc.contributor.author | Susan, Fransisca | |
| dc.contributor.author | Vaikuntanathan, Vinod | |
| dc.contributor.author | Weitzner, Daniel J | |
| dc.contributor.author | Zhang, Nicolas | |
| dc.date.accessioned | 2021-11-10T21:00:37Z | |
| dc.date.available | 2021-10-27T20:22:39Z | |
| dc.date.available | 2021-11-10T21:00:37Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/135255.2 | |
| dc.language.iso | en | |
| dc.publisher | MIT Press - Journals | en_US |
| dc.relation.isversionof | 10.1162/99608F92.B4BB506A | en_US |
| dc.rights | Creative Commons Attribution 4.0 International license | en_US |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | en_US |
| dc.source | Harvard Data Science Review | en_US |
| dc.title | SCRAM: A Platform for Securely Measuring Cyber Risk | en_US |
| dc.type | Article | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | en_US |
| dc.contributor.department | Sloan School of Management. Laboratory for Financial Engineering | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Operations Research Center | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.relation.journal | Harvard Data Science Review | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2021-03-19T13:48:45Z | |
| dspace.orderedauthors | Castro, LD; Lo, AW; Reynolds, T; Susan, F; Vaikuntanathan, V; Weitzner, DJ; Zhang, N | en_US |
| dspace.date.submission | 2021-03-19T13:48:46Z | |
| mit.license | PUBLISHER_CC | |
| mit.metadata.status | Publication Information Needed | en_US |
