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dc.contributor.authorSatat, Guy
dc.contributor.authorTancik, Matthew
dc.contributor.authorGupta, Otkrist
dc.contributor.authorHeshmat, Barmak
dc.contributor.authorRaskar, Ramesh
dc.date.accessioned2021-10-27T20:29:13Z
dc.date.available2021-10-27T20:29:13Z
dc.date.issued2017
dc.identifier.urihttps://hdl.handle.net/1721.1/135770
dc.description.abstract© 2017 Optical Society of America. We demonstrate an imaging technique that allows identification and classification of objects hidden behind scattering media and is invariant to changes in calibration parameters within a training range. Traditional techniques to image through scattering solve an inverse problem and are limited by the need to tune a forward model with multiple calibration parameters (like camera field of view, illumination position etc.). Instead of tuning a forward model and directly inverting the optical scattering, we use a data driven approach and leverage convolutional neural networks (CNN) to learn a model that is invariant to calibration parameters variations within the training range and nearly invariant beyond that. This effectively allows robust imaging through scattering conditions that is not sensitive to calibration. The CNN is trained with a large synthetic dataset generated with a Monte Carlo (MC) model that contains random realizations of major calibration parameters. The method is evaluated with a time-resolved camera and multiple experimental results are provided including pose estimation of a mannequin hidden behind a paper sheet with 23 correct classifications out of 30 tests in three poses (76.6% accuracy on real-world measurements). This approach paves the way towards real-time practical non line of sight (NLOS) imaging applications.
dc.language.isoen
dc.publisherThe Optical Society
dc.relation.isversionof10.1364/OE.25.017466
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
dc.sourceOSA Publishing
dc.titleObject classification through scattering media with deep learning on time resolved measurement
dc.typeArticle
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratory
dc.relation.journalOptics Express
dc.eprint.versionFinal published version
dc.type.urihttp://purl.org/eprint/type/JournalArticle
eprint.statushttp://purl.org/eprint/status/PeerReviewed
dc.date.updated2019-08-02T13:23:49Z
dspace.orderedauthorsSatat, G; Tancik, M; Gupta, O; Heshmat, B; Raskar, R
dspace.date.submission2019-08-02T13:23:53Z
mit.journal.volume25
mit.journal.issue15
mit.metadata.statusAuthority Work and Publication Information Needed


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