Show simple item record

dc.contributor.authorFrasca, S.
dc.contributor.authorKorzh, B.
dc.contributor.authorColangelo, M.
dc.contributor.authorZhu, D.
dc.contributor.authorLita, A. E.
dc.contributor.authorAllmaras, J. P.
dc.contributor.authorWollman, E. E.
dc.contributor.authorVerma, V. B.
dc.contributor.authorDane, A. E.
dc.contributor.authorRamirez, E.
dc.contributor.authorBeyer, A. D.
dc.contributor.authorNam, S. W.
dc.contributor.authorKozorezov, A. G.
dc.contributor.authorShaw, M. D.
dc.contributor.authorBerggren, K. K.
dc.date.accessioned2021-11-01T14:35:00Z
dc.date.available2021-11-01T14:35:00Z
dc.date.issued2019-08-30
dc.identifier.urihttps://hdl.handle.net/1721.1/136930
dc.description.abstractWe estimate the depairing current of superconducting nanowire single-photon detectors (SNSPDs) by studying the dependence of the nanowires' kinetic inductance on their bias current. The kinetic inductance is determined by measuring the resonance frequency of resonator-style nanowire coplanar waveguides both in transmission and reflection configurations. Bias current dependent shifts in the measured resonant frequency correspond to the change in the kinetic inductance, which can be compared with theoretical predictions. We demonstrate that the fast relaxation model described in the literature accurately matches our experimental data and provides a valuable tool for determination of the depairing current. Accurate measurement of the depairing current is critical for nanowire quality analysis, as well as modeling efforts aimed at understanding the detection mechanism in SNSPDs.en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.100.054520en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleDetermining the depairing current in superconducting nanowire single-photon detectorsen_US
dc.typeArticleen_US
dc.identifier.citationPhys. Rev. B 100, 054520 (2019)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.mitlicensePUBLISHER_POLICY
dc.identifier.mitlicensePUBLISHER_POLICY
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-09-05T18:31:59Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.date.submission2019-09-05T18:31:59Z
mit.metadata.statusAuthority Work and Publication Information Needed


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record