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dc.contributor.authorBernlochner, Florian
dc.contributor.authorStewart, Iain W.
dc.date.accessioned2021-11-04T16:56:49Z
dc.date.available2021-11-04T16:56:49Z
dc.date.issued2013-08-22
dc.identifier.urihttps://hdl.handle.net/1721.1/137373
dc.description.abstract© Copyright owned by the author(s) under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike Licence. The goal of the SIMBA collaboration is to provide a global fit to the available measurements of inclusive B?Xs? and B?Xul? decays. By performing a global fit one is able to simultaneously determine the relevant normalizations, i.e. the total B ? Xs? rate and the CKM-matrix element |Vub|, together with the required hadronic parameters, most importantly the b-quark mass and the b-quark distribution function in the B-meson, called the shape function. In this talk, the current status on the model-independent determination of the shape function and |C7inclVtbVts*|, which parametrizes the total B?Xs? rate, from a global fit to the available B?Xs? measurements from BABAR and Belle is presented. In particular, the theoretical uncertainties originating from variations of the different factorization scales are evaluated.en_US
dc.language.isoen
dc.publisherSissa Medialaben_US
dc.relation.isversionof10.22323/1.174.0370en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceProceedings of Scienceen_US
dc.titleA model independent determination of the B → Xsγ decay rateen_US
dc.typeArticleen_US
dc.identifier.citationBernlochner, Florian and Stewart, Iain W. 2013. "A model independent determination of the B → Xsγ decay rate."
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-05-02T14:05:20Z
dspace.date.submission2019-05-02T14:05:21Z
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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