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dc.contributor.authorJaroensri, Ronnachai
dc.contributor.authorParis, Sylvain
dc.contributor.authorHertzmann, Aaron
dc.contributor.authorBychkovsky, Vladimir
dc.contributor.authorDurand, Fredo
dc.date.accessioned2022-01-03T15:04:12Z
dc.date.available2021-11-05T18:45:28Z
dc.date.available2022-01-03T15:04:12Z
dc.date.issued2015-04
dc.identifier.urihttps://hdl.handle.net/1721.1/137576.2
dc.description.abstract© 2015 IEEE. There is often more than one way to select tonal adjustment for a photograph, and different individuals may prefer different adjustments. However, selecting good adjustments is challenging. This paper describes a method to predict whether a given tonal rendition is acceptable for a photograph, which we use to characterize its range of acceptable adjustments. We gathered a dataset of image acceptability'' over brightness and contrast adjustments. We find that unacceptable renditions can be explained in terms of over-exposure, under-exposure, and low contrast. Based on this observation, we propose a machine-learning algorithm to assess whether an adjusted photograph looks acceptable. We show that our algorithm can differentiate unsightly renditions from reasonable ones. Finally, we describe proof-of- concept applications that use our algorithm to guide the exploration of the possible tonal renditions of a photograph.en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/iccphot.2015.7168372en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titlePredicting Range of Acceptable Photographic Tonal Adjustmentsen_US
dc.typeArticleen_US
dc.identifier.citationJaroensri, Ronnachai, Paris, Sylvain, Hertzmann, Aaron, Bychkovsky, Vladimir and Durand, Fredo. 2015. "Predicting Range of Acceptable Photographic Tonal Adjustments."en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-05-29T12:35:47Z
dspace.date.submission2019-05-29T12:35:48Z
mit.metadata.statusPublication Information Neededen_US


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