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dc.contributor.authorDefferriere, Thomas
dc.contributor.authorKalaev, Dmitri
dc.contributor.authorRupp, Jennifer L. M.
dc.contributor.authorTuller, Harry L.
dc.date.accessioned2022-02-08T16:21:17Z
dc.date.available2022-02-08T16:21:17Z
dc.date.issued2021-01-22
dc.date.submitted2020-12-20
dc.identifier.issn1616-301X
dc.identifier.issn1616-3028
dc.identifier.urihttps://hdl.handle.net/1721.1/140221
dc.description.abstractEnhanced ionic mobility in mixed ionic and electronic conducting solids contributes to improved performance of memristive memory, energy storage and conversion, and catalytic devices. Ionic mobility can be significantly depressed at reduced temperatures, for example, due to defect association and therefore needs to be monitored. Measurements of ionic transport in mixed conductors, however, proves to be difficult due to dominant electronic conductivity. This study examines the impact of different levels of quenched-in oxygen deficiency on the oxygen vacancy mobility near room temperature. A praseodymium doped ceria (Pr0.1Ce0.9O2–δ ) film is grown by pulsed laser deposition and annealed in various oxygen partial pressures to modify its oxygen vacancy concentration. Changes in film non-stoichiometry are monitored by tracking the optical absorption related to the oxidation state of Pr ions. A 13-fold increase in ionic mobility at 60 °C for increases in oxygen non-stoichiometry from 0.032 to 0.042 is detected with negligible changes in migration enthalpy and large changes in pre-factor. Several factors potentially contributing to the large pre-factor changes are examined and discussed. Insights into how ionic defect concentration can markedly impact ionic mobility should help in elucidating the origins of variations seen in nanoionic devices.en_US
dc.languageen
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/adfm.202005640en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceWileyen_US
dc.titleImpact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperature Ionic Mobility in Polaronic Mixed‐Ionic‐Electronic Conducting Thin Filmsen_US
dc.typeArticleen_US
dc.identifier.citationDefferriere, T., Kalaev, D., Rupp, J. L. M., Tuller, H. L., Impact of Oxygen Non-Stoichiometry on Near-Ambient Temperature Ionic Mobility in Polaronic Mixed-Ionic-Electronic Conducting Thin Films. Adv. Funct. Mater. 2021, 31, 2005640en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.relation.journalAdvanced Functional Materialsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.date.submission2022-02-08T14:20:50Z
mit.journal.volume31en_US
mit.journal.issue14en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work Neededen_US


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